Open Access Article
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Expression of concern: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs
Mohamed Ben Bechir*a and
Mehdi Akermibc
aLaboratory of Spectroscopic and Optical Characterization of Materials (LaSCOM), Faculty of Sciences, University of Sfax, 3000 Sfax, Tunisia. E-mail: mohamedbenbechir@hotmail.com
bDepartment Physics, College of Sciences, Jazan University, P. O. Box 114, Jazan, Kingdom of Saudi Arabia. E-mail: makermi@jazanu.edu.sa
cLaboratory of Interfaces and Advanced Materials, Faculty of Science, Boulevard of the Environment, University of Monastir, Monastir, Tunisia
First published on 23rd December 2024
Abstract
Expression of concern for ‘Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs’ by Mohamed Ben Bechir et al., RSC Adv., 2024, 14, 9228–9242, https://doi.org/10.1039/D4RA01454E.
RSC Advances is publishing this expression of concern in order to alert readers about concerns that have been raised regarding the BVS analysis and the NPD measurement. An expression of concern will continue to be associated with the article until a conclusive outcome is reached.
Laura Fisher
17th December 2024
Executive Editor, RSC Advances
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