Origin of resistive-switching behaviors of chemical solution deposition-derived BiFeO3 thin-film memristors

Abstract

Oxide-based memristors have good application prospects in the brain-like computing of the in-memory computing architecture, which can effectively solve the memory wall and power wall problems in the bottleneck of the von Neumann architecture in which computation and storage are physically separated. The ferroelectric-oxide memristor shows more prominent advantages, such as ultra-fast reading and writing speed and extremely low energy consumption. However, the origin of the resistive switching phenomenon of ferroelectric oxides has been controversial. Herein, we used a ferroelectric BiFeO₃ memristor as a model system to investigate the ferroresistive and non-ferroresistive-switching behaviors under different applied bias voltages and frequencies. Results showed that the memristive behavior was caused by ferroelectric polarization at high frequencies; conversely, at low frequencies, the memristive behavior originated from the defect electroforming process driven by a large electric field. The ferroelectric-based retention and antifatigue properties of the BiFeO₃ memristor were superior to those of electroforming processes based on redox reactions. The mechanism of charge transport through interfacial barriers and the origin of the observed resistive-switching effect were discussed using a metal–insulator–ferroelectric–insulator–semiconductor model. Our findings may explain the controversy over the origin of resistive switches in ferroelectric thin films and pave the way for further ferroelectric-memristor applications.