The interpretation of Onsager cross transport coefficients measured in mixed ionic electronic conductor (MIEC) oxides is examined. It is demonstrated that the cross terms are an artifact of the way the measurements are analyzed. When an appropriate, comprehensive defect model is considered for the MIEC, no cross terms are required.
I. Riess, Phys. Chem. Chem. Phys., 2014, 16, 22513 DOI: 10.1039/C4CP03154G
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