* Corresponding authors

^a Wuhan National Laboratory for Optoelectronics (WNLO), Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan, Hubei 430074, PR China
E-mail: xyli@mail.hust.edu.cn

^b School of Measuring and Optical Engineering, Nanchang Hangkong University, Nanchang, Jiangxi 330063, P. R. China

^c School of Physics and Electronic-information Engineering, Hubei Engineering University, Xiaogan 432000, P. R. China

^d Department of Electrical and Computer Engineering, University of Nebraska, Lincoln, NE, USA