Issue 48, 2021
From the journal:

Journal of Materials Chemistry C

Correction: Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy

Federico Chianese,*ab   Sandra Fusco,ac   Mario Barra,b   Fabio Chiarella,b   Antonio Carellac  and  Antonio Cassineseab  

* Corresponding authors

a Physics Department, Università degli studi di Napoli Federico II, Piazzale Tecchio 80, 80126 Naples, Italy
E-mail: federico.chianese@unina.it

b CNR-SPIN, Division of Naples, Piazzale Tecchio 80, 80126 Naples, Italy

c Department of Chemical Sciences, Università degli studi di Napoli Federico II, Complesso universitario di Monte S. Angelo, Via Cintia 21, 80126 Naples, Italy

Abstract

Correction for ‘Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy’ by Federico Chianese et al., J. Mater. Chem. C, 2021, DOI: 10.1039/d1tc04840f.

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Article information

DOI
https://doi.org/10.1039/D1TC90260A
Article type
Correction
Submitted
26 Nov 2021
Accepted
26 Nov 2021
First published
06 Dec 2021
This article is Open Access
Creative Commons BY license

J. Mater. Chem. C, 2021,9, 17543-17543

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Correction: Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy

F. Chianese, S. Fusco, M. Barra, F. Chiarella, A. Carella and A. Cassinese, J. Mater. Chem. C, 2021, 9, 17543 DOI: 10.1039/D1TC90260A

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