Issue 2, 2023
From the journal:

Physical Chemistry Chemical Physics

Depth-resolved oxidational studies of Be/Al periodic multilayers investigated by X-ray photoelectron spectroscopy†

Niranjan Kumar, ORCID logo *a   Roman S. Pleshkov,a   B. S. Prathibha,b   Vladimir N. Polkovnikov,a   Nikolay I. Chkhalo,a   Vladimir A. Golyashovcd  and  Oleg E. Tereshchenkocd  

* Corresponding authors

a Institute for Physics of Microstructures, RAS, Afonino, Nizhny Novgorod 603087, Russia
E-mail: kumar@ipmras.ru
Fax: (831) 417 94 64
Tel: (831) 417 94 65

b BNM Institute of Technology, Bangalore, Karnataka 560070, India

c Institute of Semiconductor Physics, SB RAS, Novosibirsk 630090, Russia

d Synchrotron Radiation Facility SKIF, Boreskov Institute of Catalysis, SB RAS, Kol’tsovo 630559, Russia

Abstract

The quantification of surface and subsurface oxidation of Be/Al periodic multilayer mirrors due to exposure in the ambient atmosphere was investigated by depth-resolved X-ray photoelectron spectroscopy. The contribution of oxidation was lower for the thicker layer of Al in the periodic structures since the surface was less chemically reactive for the oxidation. This was investigated by finding the depth-resolved slope of the intensity ratio of metal/oxides (Be/BeOx and Al/AlOx) by analyzing the chemical shift of Al 1s and Be 1s photoelectrons. Furthermore, a well-resolved doublet chemical shift in the O 1s spectra indicated the formation of BeOx/AlOx and BeOH/AlOH oxides. The investigation showed that the subsurface and surface regions were dominated by metal–hydroxide (BeOH/AlOH) and metal–oxide (BeOx/AlOx) bonding, respectively, analyzed by the depth-resolved chemical shifts.

Graphical abstract: Depth-resolved oxidational studies of Be/Al periodic multilayers investigated by X-ray photoelectron spectroscopy

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Article information

DOI
https://doi.org/10.1039/D2CP04778K
Article type
Paper
Submitted
13 Oct 2022
Accepted
01 Dec 2022
First published
02 Dec 2022

Phys. Chem. Chem. Phys., 2023,25, 1205-1213

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Depth-resolved oxidational studies of Be/Al periodic multilayers investigated by X-ray photoelectron spectroscopy

N. Kumar, R. S. Pleshkov, B. S. Prathibha, V. N. Polkovnikov, N. I. Chkhalo, V. A. Golyashov and O. E. Tereshchenko, Phys. Chem. Chem. Phys., 2023, 25, 1205 DOI: 10.1039/D2CP04778K

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