Issue 54, 2024
From the journal:

RSC Advances

Expression of concern: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs

Mohamed Ben Bechir*a  and  Mehdi Akermibc  

* Corresponding authors

a Laboratory of Spectroscopic and Optical Characterization of Materials (LaSCOM), Faculty of Sciences, University of Sfax, 3000 Sfax, Tunisia
E-mail: mohamedbenbechir@hotmail.com

b Department Physics, College of Sciences, Jazan University, P. O. Box 114, Jazan, Kingdom of Saudi Arabia
E-mail: makermi@jazanu.edu.sa

c Laboratory of Interfaces and Advanced Materials, Faculty of Science, Boulevard of the Environment, University of Monastir, Monastir, Tunisia

Abstract

Expression of concern for ‘Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs’ by Mohamed Ben Bechir et al., RSC Adv., 2024, 14, 9228–9242, https://doi.org/10.1039/D4RA01454E.

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Article information

DOI
https://doi.org/10.1039/D4RA90155J
Article type
Expression of Concern
Submitted
18 Dec 2024
Accepted
18 Dec 2024
First published
23 Dec 2024
This article is Open Access
Creative Commons BY license

RSC Adv., 2024,14, 40179-40179

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Expression of concern: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs

M. Ben Bechir and M. Akermi, RSC Adv., 2024, 14, 40179 DOI: 10.1039/D4RA90155J

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