Issue 18, 2004

Conducting oriented-[(n-C4H9)4N]2[Ni(dcbdt)2]5 and new (BEDT-TTF)[Ni(dcbdt)2] phases as microcrystalline films, electrodeposited on silicon substrates

Abstract

Ni(dcbdt)2-based molecular materials, namely [(n-C4H9)4N]2[Ni(dcbdt)2]5, and (BEDT-TTF)[Ni(dcbdt)2] have been processed as microcrystalline films on (001)-oriented silicon substrates using the electrodeposition technique [dcbdt2−: 4,5-dicyanobenzene-1,2-dithiolato; BEDT-TTF: bis(ethylenedithio)tetrathiafulvalene]. Electrodeposited [(n-C4H9)4N]2[Ni(dcbdt)2]5 is made of thin platelets. Elemental analysis and X-ray photoelectron spectroscopy data are in agreement with a 2 : 5 stoichiometry. X-Ray powder diffraction measurements indicate that the growth is highly anisotropic, the ab-plane being parallel to the silicon surface. The films exhibit a semiconducting behaviour with a room-temperature conductivity of about 1.2 × 10−2 S cm−1. Electrodeposition run in the presence of the BEDT-TTF donor molecule leads to faceted microcrystals (size: 5–100 μm) of (BEDT-TTF)[Ni(dcbdt)2] as evidenced by scanning electron microscopy. Single crystal data show that this new (BEDT-TTF)[Ni(dcbdt)2] phase is isostructural to the previously described (BEDT-TTF)[Au(dcbdt)2]. Again, elemental analysis and X-ray photoelectron spectroscopy data are in agreement with a 1 : 1 stoichiometry. The room-temperature conductivity of the film is about 3 × 10−6 S cm−1. This low value is comparable to that measured on (BEDT-TTF)[Au(dcbdt)2] single crystals. For both materials the charge transfer is similar, as consistently evaluated from Raman, infrared and photoemission measurements.

Graphical abstract: Conducting oriented-[(n-C4H9)4N]2[Ni(dcbdt)2]5 and new (BEDT-TTF)[Ni(dcbdt)2] phases as microcrystalline films, electrodeposited on silicon substrates

Article information

Article type
Paper
Submitted
23 Apr 2004
Accepted
29 Jun 2004
First published
09 Aug 2004

J. Mater. Chem., 2004,14, 2801-2805

Conducting oriented-[(n-C4H9)4N]2[Ni(dcbdt)2]5 and new (BEDT-TTF)[Ni(dcbdt)2] phases as microcrystalline films, electrodeposited on silicon substrates

D. de Caro, H. Alves, M. Almeida, S. Caillieux, M. Elgaddari, C. Faulmann, I. Malfant, F. Senocq, J. Fraxedas, A. Zwick and L. Valade, J. Mater. Chem., 2004, 14, 2801 DOI: 10.1039/B406122E

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