Identification of local silicon cluster nanostructures inside SixGe1−x alloy nanocrystals by Raman spectroscopy

L. Z. Liu; X. L. Wu; J. C. Shen; T. H. Li; F. Gao; Paul K. Chu

doi:10.1039/C0CC01277G

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Identification of local siliconclusternanostructures inside Si_xGe_1−x alloy nanocrystals by Raman spectroscopy

L. Z. Liu,^a X. L. Wu,*^a J. C. Shen,^a T. H. Li,^a F. Gao^a and Paul K. Chu^b

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* Corresponding authors

^a Nanjing National Laboratory of Microstructures and Department of Physics, Nanjing University, Nanjing 210093, P. R.China
E-mail: hkxlwu@nju.edu.cn
Fax: +86-25-83595535
Tel: +86-25-83686303

^b Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China

Abstract

By experimentally examining and theoretically analyzing the Raman spectra of Si_xGe_1−x nanocrystal-embedded silica films, we show that the 430 cm⁻¹ Si–Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside Si_xGe_1−x nanocrystals with high silicon content.

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Article information

DOI: https://doi.org/10.1039/C0CC01277G
Article type: Communication
Submitted: 07 May 2010
Accepted: 26 May 2010
First published: 24 Jun 2010

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Chem. Commun., 2010,46, 5539-5541

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Identification of local silicon cluster nanostructures inside Si_xGe_1−x alloy nanocrystals by Raman spectroscopy

L. Z. Liu, X. L. Wu, J. C. Shen, T. H. Li, F. Gao and P. K. Chu, Chem. Commun., 2010, 46, 5539 DOI: 10.1039/C0CC01277G

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