Issue 45, 2010
From the journal:

Chemical Communications

Direct observation of layered structures at ionic liquid/solid interfaces by using frequency-modulation atomic force microscopy†

Yasuyuki Yokota,*a   Tomohiro Haradaa  and  Ken-ichi Fukui*a  

* Corresponding authors

a Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka, Japan
E-mail: yyokota@chem.es.osaka-u.ac.jp, kfukui@chem.es.osaka-u.ac.jp
Fax: +81 6-6850-6235
Tel: +81 6-6850-6235

Abstract

Presence of inhomogeneous layered structures of ionic liquid (IL) molecules at IL/HOPG and IL/mica interfaces was directly detected and imaged by using frequency-modulation atomic force microscopy. High stability of the layered structures may disturb their interface applications to catalysis and electrochemistry.

Graphical abstract: Direct observation of layered structures at ionic liquid/solid interfaces by using frequency-modulation atomic force microscopy

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Article information

DOI
https://doi.org/10.1039/C0CC02643C
Article type
Communication
Submitted
18 Jul 2010
Accepted
24 Sep 2010
First published
12 Oct 2010

Chem. Commun., 2010,46, 8627-8629

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Direct observation of layered structures at ionic liquid/solid interfaces by using frequency-modulation atomic force microscopy

Y. Yokota, T. Harada and K. Fukui, Chem. Commun., 2010, 46, 8627 DOI: 10.1039/C0CC02643C

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