Issue 5, 2010
From the journal:

CrystEngComm

Characterisation of amorphous and nanocrystalline molecular materials by total scattering†

Simon J. L. Billinge,*ab   Timur Dykhne,a   Pavol Juhás,a   Emil Božin,ab   Ryan Taylor,c   Alastair J. Florencec  and  Kenneth Shanklandd  

* Corresponding authors

a Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, USA
E-mail: sb2896@columbia.edu
Fax: +1 212-854-8257
Tel: +1 212-854-2918

b Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA

c Solid-State Research Group, Strathclyde Institute of Pharmacy and Biomedical Sciences, University of Strathclyde, Glasgow, UK

d School of Pharmacy, University of Reading, Reading, UK

Abstract

The use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticals carbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.

Graphical abstract: Characterisation of amorphous and nanocrystalline molecular materials by total scattering

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Article information

DOI
https://doi.org/10.1039/B915453A
Article type
Communication
Submitted
28 Jul 2009
Accepted
07 Oct 2009
First published
19 Oct 2009

CrystEngComm, 2010,12, 1366-1368

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Characterisation of amorphous and nanocrystalline molecular materials by total scattering

S. J. L. Billinge, T. Dykhne, P. Juhás, E. Božin, R. Taylor, A. J. Florence and K. Shankland, CrystEngComm, 2010, 12, 1366 DOI: 10.1039/B915453A

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