Array-type microchip sampling to determine trace metal in photoresist used in semiconductor manufacturing process
Abstract
In this work, the
* Corresponding authors
a
Department of Chemistry, Dankook University, 126 Jukjeon-dong, Suji-gu, Yongin-si, Gyeonggi-do, Korea
E-mail:
plasma@dankook.ac.kr, hblim@dku.edu
Fax: +82 31 80053148
Tel: +82 31 80053159
In this work, the
H. Choi, S. Ma, J. S. Lee and H. B. Lim, J. Anal. At. Spectrom., 2010, 25, 710 DOI: 10.1039/B916064G
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