Issue 9, 2011
From the journal:

Chemical Communications

Observation of a two-dimensional halogen-bonded cocrystal at sub-monolayer coverage using synchrotron X-ray diffraction†

Stuart M. Clarke,*ab   Tomislav Friščić,b   William Jones,b   Anasuya Mandal,a   Chenguang Suna  and  Julia E. Parkerc  

* Corresponding authors

a BP Institute, University of Cambridge, Cambridge, UK
E-mail: stuart@bpi.cam.ac.uk
Fax: +44 (0)1223 765701
Tel: +44 (0)1223 765700

b Department of Chemistry, University of Cambridge, Cambridge, UK

c Diamond Light Source, Diamond House, Harwell Science and Innovation Campus, Didcot, Oxon, UK

Abstract

The formation of two-dimensional halogen-bonded layers of 4,4′-bipyridyl and 1,4-diiodotetrafluorobenzene was observed on a graphite surface at sub-monolayer coverage using synchrotron X-ray diffraction; the use of the diffraction technique enabled, for the first time, the measurement of I⋯N halogen bonding distances in a two-dimensional cocrystal and the identification of the halogen bonding interaction in the monolayer.

Graphical abstract: Observation of a two-dimensional halogen-bonded cocrystal at sub-monolayer coverage using synchrotron X-ray diffraction

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Article information

DOI
https://doi.org/10.1039/C0CC04400H
Article type
Communication
Submitted
14 Oct 2010
Accepted
02 Dec 2010
First published
23 Dec 2010

Chem. Commun., 2011,47, 2526-2528

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Observation of a two-dimensional halogen-bonded cocrystal at sub-monolayer coverage using synchrotron X-ray diffraction

S. M. Clarke, T. Friščić, W. Jones, A. Mandal, C. Sun and J. E. Parker, Chem. Commun., 2011, 47, 2526 DOI: 10.1039/C0CC04400H

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