Issue 2, 2011

Structural and dynamic properties of oxygen vacancies in perovskite oxides—analysis of defect chemistry by modern multi-frequency and pulsed EPR techniques

Abstract

Multi-frequency and pulsed electron paramagnetic resonance (EPR) provides a sensitive spectroscopic tool to elucidate the defect structure of transition-metal doped perovskite oxides, as well as to monitor dynamic processes of oxygen vacancies in these materials. In this regard, high-frequency EPR spectrometers and pulsed EPR techniques such as the hyperfine sublevel correlation experiment (HYSCORE) may now routinely be used for dedicated investigations, providing considerably more insight than the application of standard continuous-wave EPR. Recent results include the formation of defect complexes between acceptor-type transition-metal centers with either one or two oxygen vacancies for the reason of charge compensation. Furthermore, such defect complexes follow the domain switching upon poling ferroelectric compounds with correspondingly high electric fields. On the other hand, multi-valent manganese functional centers provide trapping centers for electronic and ionic charge carriers (e′, Image ID:b918782k-t1.gif) such that valency altered Image ID:b918782k-t2.gif acceptor states or Image ID:b918782k-t3.gif defect complexes are formed. Additionally, the trapping of charge carriers at the intrinsic ‘reduced’ B-site ions, Image ID:b918782k-t4.gif and Image ID:b918782k-t5.gif, can be observed by means of EPR spectroscopy.

Graphical abstract: Structural and dynamic properties of oxygen vacancies in perovskite oxides—analysis of defect chemistry by modern multi-frequency and pulsed EPR techniques

Article information

Article type
Perspective
Submitted
09 Sep 2009
Accepted
02 Sep 2010
First published
17 Nov 2010

Phys. Chem. Chem. Phys., 2011,13, 368-384

Structural and dynamic properties of oxygen vacancies in perovskite oxides—analysis of defect chemistry by modern multi-frequency and pulsed EPR techniques

Rüdiger-A. Eichel, Phys. Chem. Chem. Phys., 2011, 13, 368 DOI: 10.1039/B918782K

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