Identification of structural defects in graphitic materials by gas-phase anisotropic etching†
Abstract
We developed a method of identifying the structural defects in graphitic materials by an anisotropic etching technique. Intrinsic and oxygen- or argon- plasma induced artificial defects’ density and domain size can be obtained easily and precisely. It was inferred, through our investigations, that the grade ZYA highly oriented pyrolytic graphite (HOPG) sample has a better crystal quality, with a lower defect density, while the Kish