In this report, it was found that the Napierian logarithm of the electrical resistance is proportional to the reciprocal thickness for the platinum nanofilms. A new method was proposed to determine the thickness of platinum nanofilm simply by measuring its electrical resistance, which is fast and cost effective.
Y. Sun, Z. Wen, F. Xu, Y. Zhang, Y. Shi, H. Dai and Z. Li, Anal. Methods, 2014, 6, 337 DOI: 10.1039/C3AY41488D
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