Issue 15, 2014

Selective removal of metallic single-walled carbon nanotubes in full length by organic film-assisted electrical breakdown

Abstract

An organic film-assisted electrical breakdown technique is proposed to selectively remove metallic (m-) single-walled carbon nanotubes (SWNTs) in full length towards creation of pure semiconducting SWNT arrays which are available for the large-scale fabrication of field effect transistors (FETs). The electrical breakdown of horizontally aligned SWNT arrays embedded in organic films resulted in a maximum removal length of 16.4 μm. The removal of SWNTs was confirmed using scanning electron microscopy and Raman mapping measurements. The on/off ratios of FETs were improved up to ca. 10 000, similar to that achieved for in-air breakdown. The experimental results suggest that exothermic oxidation of organic films induces propagation of oxidation reaction, hence the long-length removal of m-SWNTs.

Graphical abstract: Selective removal of metallic single-walled carbon nanotubes in full length by organic film-assisted electrical breakdown

Article information

Article type
Paper
Submitted
28 Mar 2014
Accepted
09 May 2014
First published
12 May 2014
This article is Open Access
Creative Commons BY license

Nanoscale, 2014,6, 8831-8835

Selective removal of metallic single-walled carbon nanotubes in full length by organic film-assisted electrical breakdown

K. Otsuka, T. Inoue, S. Chiashi and S. Maruyama, Nanoscale, 2014, 6, 8831 DOI: 10.1039/C4NR01690D

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