Optical identification of layered MoS2via the characteristic matrix method

Abstract

It is demonstrated that the characteristic matrix method is effective and reliable for the optical identification of two-dimensional layered nanomaterials on different substrates. By using this method, the authors calculate the reflectivity and optical contrast of layered MoS₂ crystallites prepared on quartz by chemical vapor deposition. It is found that the measured pixel intensity of an MoS₂ optical image under continuous spectrum light is proportional to the calculated reflectivity, and that the theoretical optical contrast agrees well with the experimental results. This work provides a new way for the calculation of the optical contrast of the 2D nanomaterials and layered heterostructures on various substrates.