Issue 36, 2016
From the journal:

Nanoscale

Tracking of photochemical Ostwald ripening of nanoparticles through voltammetric atom counting†

Thomas R. Bartlett,‡a   Stanislav V. Sokolov,‡a   Blake J. Plowman,a   Neil P. Youngb  and  Richard G. Compton*a  

* Corresponding authors

a Department of Physical and Theoretical Chemistry, Oxford University, South Parks Road, Oxford, UK
E-mail: richard.compton@chem.ox.ac.uk

b Department of Materials, Oxford University, Parks Road, Oxford, UK

Abstract

We report the tracking of atom count in individual nanoparticles during photochemical Ostwald ripening. The nano-impact technique, in conjunction with UV-Vis and TEM analysis, is used to follow the photochemical formation of silver nano-prisms from spherical seed particles. A mechanism of photochemical Ostwald ripening is deduced and key growth stages are identified.

Graphical abstract: Tracking of photochemical Ostwald ripening of nanoparticles through voltammetric atom counting

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Article information

DOI
https://doi.org/10.1039/C6NR05740C
Article type
Communication
Submitted
20 Jul 2016
Accepted
24 Aug 2016
First published
26 Aug 2016

Nanoscale, 2016,8, 16177-16181

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Tracking of photochemical Ostwald ripening of nanoparticles through voltammetric atom counting

T. R. Bartlett, S. V. Sokolov, B. J. Plowman, N. P. Young and R. G. Compton, Nanoscale, 2016, 8, 16177 DOI: 10.1039/C6NR05740C

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