Tb3+-doped LaF3 nanocrystals for correlative cathodoluminescence electron microscopy imaging with nanometric resolution in focused ion beam-sectioned biological samples

K. Keevend; M. Stiefel; A. L. Neuer; M. T. Matter; A. Neels; S. Bertazzo; I. K. Herrmann

doi:10.1039/C6NR09187C

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Tb³⁺-doped LaF₃ nanocrystals for correlative cathodoluminescence electron microscopy imaging with nanometric resolution in focused ion beam-sectioned biological samples†

K. Keevend,^a M. Stiefel,^b A. L. Neuer,^a M. T. Matter,^a A. Neels,^c S. Bertazzo^d and I. K. Herrmann

*^a

Author affiliations

* Corresponding authors

^a Particles-Biology Interactions, Department Materials Meet Life, Swiss Federal Laboratories for Materials Science and Technology (Empa), Lerchenfeldstrasse 5, 9014 St. Gallen, Switzerland
E-mail: inge.herrmann@empa.ch

^b Reliability Science and Technology, Department Materials Meet Life, Swiss Federal Laboratories for Materials Science and Technology (Empa), Uberlandstrasse 129, 8600 Dubendorf, Switzerland

^c Center for X-ray Analytics, Department Materials Meet Life, Swiss Federal Laboratories for Materials Science and Technology (Empa), Uberlandstrasse 129, 8600 Dubendorf, Switzerland

^d Department of Medical Physics and Biomedical Engineering, University College London (UCL), Malet Place Engineering Building, London, UK
E-mail: s.bertazzo@ucl.ac.uk

Abstract

Here, we report the use of rare earth element-doped nanocrystals as probes for correlative cathodoluminescence electron microscopy (CCLEM) bioimaging. This first experimental demonstration shows potential for the simultaneous acquisition of luminescence and electron microscopy images with nanometric resolution in focused ion beam cut biological samples.

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Article information

DOI: https://doi.org/10.1039/C6NR09187C
Article type: Communication
Submitted: 25 Nov 2016
Accepted: 13 Jan 2017
First published: 16 Jan 2017

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Nanoscale, 2017,9, 4383-4387

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Tb³⁺-doped LaF₃ nanocrystals for correlative cathodoluminescence electron microscopy imaging with nanometric resolution in focused ion beam-sectioned biological samples

K. Keevend, M. Stiefel, A. L. Neuer, M. T. Matter, A. Neels, S. Bertazzo and I. K. Herrmann, Nanoscale, 2017, 9, 4383 DOI: 10.1039/C6NR09187C

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