Proton-irradiation-immune electronics implemented with two-dimensional charge-density-wave devices

Abstract

We demonstrate that charge-density-wave devices with quasi-two-dimensional 1T-TaS₂ channels show remarkable immunity to bombardment with 1.8 MeV protons to a fluence of at least 10¹⁴ H⁺cm⁻². The current–voltage characteristics of these devices do not change as a result of proton irradiation, in striking contrast to most conventional semiconductor devices or other two-dimensional devices. Only negligible changes are found in the low-frequency noise spectra. The radiation immunity of these “all-metallic” charge-density-wave devices is attributed to the quasi-2D nature of the electron transport in the nanoscale-thickness channel, high concentration of charge carriers in the utilized charge-density-wave phases, and two-dimensional device design. Such devices, capable of operating over a wide temperature range, can constitute a crucial segment of future electronics for space, particle accelerator and other radiation environments.