Amplitude response of conical multiwalled carbon nanotube probes for atomic force microscopy

Abstract

Carbon nanotubes are considered as great candidates for atomic force microscopy (AFM) probes because of their high aspect ratio and outstanding mechanical properties. In this work, we report that a conical AFM probe can be fabricated with arc discharge prepared multiwalled carbon nanotubes (MWCNTs) with an individual MWCNT at the apex by dielectrophoresis. The amplitude–displacement curve of the conical MWCNT probe demonstrates that this structure can remain stable until the force exerted on it increases to 14.0 ± 1.5 nN (nanonewton). Meanwhile, the conical MWCNT probes are able to resolve complex structure with high aspect ratio compared to commercial AFM probes, suggesting great potential for various AFM applications.