Issue 37, 2020

Reply to the ‘Comment on “Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling”’ by R. L. McCreery, S. K. Saxena, M. Supur and U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k

Abstract

Our paper [Phys. Chem. Chem. Phys., 2019, 21, 16762] is the subject of a comment that clarifies a flaw in analysis of STM data. We accept the comment in regard to the aspect ratio considerations, but we also further clarify the main conclusions of our paper, and provide a molecular scale schematic using the data presented in the comment to help refine the original conclusions. Taken together, this shows that models presented in the literature may benefit from including more fine structure details, as better understanding may emerge from such considerations. This was the intent of our original article, and we thank the comment authors for the chance to clarify these points.

Graphical abstract: Reply to the ‘Comment on “Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling”’ by R. L. McCreery, S. K. Saxena, M. Supur and U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k

Article information

Article type
Comment
Submitted
10 Jul 2020
Accepted
04 Sep 2020
First published
14 Sep 2020

Phys. Chem. Chem. Phys., 2020,22, 21547-21549

Reply to the ‘Comment on “Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling”’ by R. L. McCreery, S. K. Saxena, M. Supur and U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k

A. J. Bergren, G. A. DiLabio, C. Van Dyck, V. Mukundan and J. A. Fereiro, Phys. Chem. Chem. Phys., 2020, 22, 21547 DOI: 10.1039/D0CP03700A

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