Quantitative mapping of magnetic properties at the nanoscale with bimodal AFM

Abstract

We demonstrate that a force microscope operated in a bimodal configuration enables the mapping of magnetic interactions with high quantitative accuracy and high-spatial resolution (∼30 nm). Bimodal AFM operation doubles the number of observables with respect to conventional magnetic force microscopy methods which enables to determine quantitatively in a single processing step several magnetic properties. The theory of bimodal AFM provides analytical expressions for different magnetic force models, in particular those characterized by power-law and exponential distance dependences. Bimodal AFM provides a self-evaluation protocol to test the accuracy of the measurements. The agreement obtained between the experiments and theory for two different magnetic samples support the application of bimodal AFM to map quantitatively long-range magnetic interactions.