Issue 10, 2023

A silica-related matrix effect on NanoSIMS Li isotopic analysis of glasses and its online calibration

Abstract

Accurate Li isotope analysis of silicate glasses using secondary ion mass spectrometry (SIMS) is challenging due to the matrix effect, which causes instrumental mass fractionation (IMF). The characteristics of the matrix effect vary for each element, necessitating empirical correction methods. Here, we present Li isotopic measurements on a set of silicate glasses spanning a broad compositional range from ultramafic to highly siliceous using a Cameca NanoSIMS 50L. A radio-frequency (RF)-O primary beam with an intensity of 1 nA was rastered over a 5 × 5 μm2 area on the sample, and the secondary ions 6Li, 7Li and 30Si were simultaneously detected. We observed a significant matrix effect on δ7Li in the silicate glasses, which yielded an IMF of up to 19‰, exceeding the analytical precision of <2.5‰ (1SD). The IMF is strongly correlated with the chemical compositions of the silicate glasses. To correct the matrix effect, we employed various correction schemes, including univariate and multivariable compositions. All results consistently indicated that silica exerted a dominant influence on the IMF. We then propose a straightforward “online” method to correct this silica-related matrix effect by utilizing simultaneously measured 30Si signals. This strategy improves the accuracy of the Li isotope measurements to within 3‰ and can be widely applied to anhydrous subalkaline magmatic glasses with compositions ranging from ultramafic to highly siliceous.

Graphical abstract: A silica-related matrix effect on NanoSIMS Li isotopic analysis of glasses and its online calibration

Article information

Article type
Paper
Submitted
24 Mar 2023
Accepted
17 Aug 2023
First published
30 Aug 2023
This article is Open Access
Creative Commons BY-NC license

J. Anal. At. Spectrom., 2023,38, 1962-1972

A silica-related matrix effect on NanoSIMS Li isotopic analysis of glasses and its online calibration

R. Li, J. Hao, W. Yang, H. Tian, S. Hu and Y. Lin, J. Anal. At. Spectrom., 2023, 38, 1962 DOI: 10.1039/D3JA00100H

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