Issue 44, 2023

A high-performance logic inverter achieved using mixed-dimensional WSe2/n+-Si and MoS2/p+-Si junction field-effect transistors

Abstract

WSe2, a transition-metal dichalcogenide, has been widely investigated as a next-generation semiconducting material owing to its unique physical properties. However, device degradation of the WSe2 channel is inevitable in a metal-oxide-semiconductor structure because of the interface states. One of the solutions to this problem is to use insulator-less structures, such as metal-semiconductor field-effect transistors (FETs) or junction field-effect transistors (JFETs). We demonstrate a high performance logic inverter using JFETs with a mixed dimensional structure of transition-metal dichalcogenides and silicon materials. We apply WSe2 and an n+-Si substrate as a p-type JFET device, whereas MoS2 and a p+-Si substrate as an n-type JFET device. The fabrication process of the n-type device is similar to that reported in our previous study. The p-type properties of WSe2/n+-Si JFETs are enhanced through surface polymer doping using the perfluoro-(butenyl vinyl ether) (PBVE) coating. The hole carrier concentration, on-current and contact resistance values of the WSe2 JFETs are improved after the doping process. In contrast, as a trade-off, mobility and noise characteristics deteriorate after doping because of the surface scattering effect. Finally, we demonstrate a logic inverter by connecting a PBVE-coated WSe2/n+-Si JFET and an n-type MoS2/p+-Si JFET. Our results present an easy doping method applicable to JFET structures to achieve high performance.

Graphical abstract: A high-performance logic inverter achieved using mixed-dimensional WSe2/n+-Si and MoS2/p+-Si junction field-effect transistors

Supplementary files

Article information

Article type
Paper
Submitted
09 Aug 2023
Accepted
24 Oct 2023
First published
03 Nov 2023

J. Mater. Chem. C, 2023,11, 15649-15656

A high-performance logic inverter achieved using mixed-dimensional WSe2/n+-Si and MoS2/p+-Si junction field-effect transistors

Y. Kim, T. Kim, W. Jeong, M. S. Jeong and E. K. Kim, J. Mater. Chem. C, 2023, 11, 15649 DOI: 10.1039/D3TC02837B

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