Issue 37, 2024

First-principles investigation of reduced KDP crystal damage threshold: defect clusters in Mg-related configurations

Abstract

In this study, we utilized first-principles methods to delve into defect clusters within potassium dihydrogen phosphate (KDP) crystals, focusing on (MgK + VK) and (MgK + VH) configurations. We examined their stability, defect formation energy, lattice distortion, electronic structures, and optical properties in both paraelectric (PE-KDP) and ferroelectric (FE-KDP) phases. In the PE phase, compensation of Image ID:d4ce00624k-t1.gif was accomplished via the nearest neighbor Image ID:d4ce00624k-t2.gif. Conversely, in the FE phase, compensation of Image ID:d4ce00624k-t3.gif was achieved utilizing the next nearest neighbor Image ID:d4ce00624k-t4.gif. Notably, the Mg–O ionic bond displayed significant changes in bond length, with a maximum alteration of 60%, as neighboring oxygen atoms moved closer to the magnesium atom. Furthermore, both structures displayed a downward shift of the conduction band minimum (CBM), primarily due to contributions from Mg 3s and O 2p orbitals, resulting in a reduction in the band gap. By analyzing the photoluminescence process alongside electron–phonon coupling phenomena, absorption and emission spectra were obtained. In the absorption spectra, peaks for PE-KDP and FE-KDP were observed at 335 nm and 386 nm, respectively, consistent with experimental observations of absorption at 355 nm. Upon exposure to a 355 nm laser, local crystal absorption led to a progressive increase in temperature, consequently lowering the damage threshold.

Graphical abstract: First-principles investigation of reduced KDP crystal damage threshold: defect clusters in Mg-related configurations

Article information

Article type
Paper
Submitted
21 Jun 2024
Accepted
16 Aug 2024
First published
05 Sep 2024

CrystEngComm, 2024,26, 5267-5277

First-principles investigation of reduced KDP crystal damage threshold: defect clusters in Mg-related configurations

J. Zhu, W. Hong, T. Liu, H. Hu and L. Zhao, CrystEngComm, 2024, 26, 5267 DOI: 10.1039/D4CE00624K

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