Issue 47, 2024

Stable P3HT-PC61BM inverted organic solar cells based on cerium oxide as an electron transport layer

Abstract

The potential of cerium oxide (CeOx) as an electron transport layer (ETL) was explored in inverted bulk heterojunction organic solar cells (BHJ OSCs), using a mixture of P3HT and PC61BM as the photoactive layer, and compared with the benchmark zinc oxide (ZnO). CeOx layers on indium tin oxide or glass were obtained by spin-coating a solution prepared from Ce(OAc)3·yH2O followed by thermal annealing which was optimized. CeOx layers were characterized by different analytical techniques such as X-ray photoelectron spectroscopy showing that thermal annealing at 200 °C for 15 minutes led to the formation of CeOx, with a value of x reaching 1.70. These optimized thin layers of CeOx were successfully used as an ETL in P3HT-PC61BM inverted OSCs exhibiting power conversion efficiencies (PCEs) reaching 1.7% whereas ZnO-based devices showed a maximum PCE of 3.2%. Although annealing at 450 °C led to CeOx layers with a higher x value of 1.79, the PCEs of the devices became significantly lower due to the appearance of large crystalline clusters in the CeOx layer, as shown by AFM, likely producing short circuits. ZnO thin films doped with 3 mol% of CeOx were tested leading to a slight decrease of the photovoltaic efficiency. Importantly, the efficiency of the CeOx-based OSCs increased up to 2.1% after two weeks and remained higher than the initial value after one month, while OSCs based on ZnO doped with CeOx retained 85% of their initial PCE after five months of storage. These results open up interesting perspectives for the development of stable electronic devices.

Graphical abstract: Stable P3HT-PC61BM inverted organic solar cells based on cerium oxide as an electron transport layer

Supplementary files

Article information

Article type
Paper
Submitted
22 Oct 2024
Accepted
05 Nov 2024
First published
05 Nov 2024

New J. Chem., 2024,48, 19779-19790

Stable P3HT-PC61BM inverted organic solar cells based on cerium oxide as an electron transport layer

S. Abidi, A. H. Habibi, H. Melville, S. Dabos-Seignon, O. Segut, T. Breton, E. Levillain, C. Cabanetos, S. Touihri and P. Blanchard, New J. Chem., 2024, 48, 19779 DOI: 10.1039/D4NJ04579C

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