Novel single-crystalline Hf1−xTixO2 1D nanostructures with room-temperature ferromagnetism†
Abstract
Dilute magnetic semiconductor oxides (DMSOs) hold great promise in bridging spintronics with semiconductor electronics, offering the potential for highly compact, high data-processing devices with reduced power consumption. Oxygen-deficient HfO2 stands out among DMSOs due to its technologically important characteristics—large dielectric constant (κ ≅ 25), high refractive index (2.9) and excellent compatibility with CMOS technology. The origin of ferromagnetism in DMSOs, including HfO2, is mainly attributed to oxygen vacancies. Two main strategies have been explored to enhance ferromagnetism in DMSOs: synthesizing low-dimensional nanostructures to increase oxygen vacancies via a high surface-to-volume ratio (i.e. a high specific surface area) and material doping with appropriate magnetic or non-magnetic ions to induce further vacancies within the lattice. The fabrication of doped 1D nanostructures combines both approaches to enhance ferromagnetism in DMSOs. To date, the fabrication of doped single-crystalline HfO2 1D nanostructures has remained elusive due to technical challenges. This work pioneers the fabrication of Ti-doped HfO2 (i.e., Hf1−xTixO2; 0.01 ≤ x ≤ 0.50) 1D nanostructures with novel magnetic properties by using catalyst-assisted pulsed laser deposition. Increasing the Ti content is found to lead to shorter Hf1−xTixO2 1D nanostructures, while, interestingly, the resulting magnetic properties show enhancement with increased Ti content, with Hf1−xTixO2 (10 at% Ti doping) exhibiting saturation magnetization nearly twice that of undoped HfO2 nanowires. Given the high compatibility of Hf1−xTixO2 with CMOS technology and their critical temperature above room temperature, these novel nanostructures promise new applications in spintronic-CMOS integrated device technology.