High-performance solar-blind imaging photodetectors based on micrometer-thick β-Ga2O3 films grown by thermal oxidation of gallium†
Abstract
Almost all reported high-performance β-Ga2O3 films are grown by molecular beam epitaxy, metal organic chemical vapor deposition, and pulsed laser deposition at very high cost and low yield. A method for preparing micron-thick Ga2O3 films by in situ thermal oxidation of gallium without vacuum and catalysts is reported for the first time. The results show that the thickness of our typical Ga2O3 film exceeds 2 μm, the typical grain size reaches the micrometer level, and it is high-purity single-phase β-Ga2O3. The photodetector based on the thick β-Ga2O3 film has a responsivity of more than 1.7 A W−1, a light-to-dark current ratio of more than 103, a detectivity of more than 1.5 × 1013 cm Hz1/2 W−1, self-powered characteristics, and good solar-blind ultraviolet imaging properties. The potential mechanisms of high gain and self-powered characteristics of our device are analyzed. Our research results provide a method for the preparation of high-quality thick gallium oxide films and solar-blind ultraviolet photodetectors.