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Diffuse Layer Effect on Electron-Transfer Kinetics Measured by Scanning Electrochemical Microscopy (SECM)

By Bae, Je Hyun; Yu, Yun; Mirkin, Michael V

Publication Date: 2017

Journal: The journal of physical chemistry letters

Volume: 8

Issue: 7

Page: 1338-1342

ISSN: 1948-7185

Resource: Article

PMID: 28286950

DOI: 10.1021/acs.jpclett.7b00161

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