Walter
Jung
ab,
Bodo
Böhme
a,
Julia M.
Hübner
a,
Ulrich
Burkhardt
a,
Horst
Borrmann
a,
Matej
Bobnar
a,
Hong Duong
Nguyen
ac,
Ingo
Pantenburg
b,
Martin
Etter
d,
Ulrich
Schwarz
a,
Yuri
Grin
a and
Michael
Baitinger
*a
aMax-Planck-Institut für Chemische Physik fester Stoffe, Nöthnitzer Straße 40, 01187 Dresden, Germany. E-mail: Michael.Baitinger@cpfs.mpg.de
bDepartment für Chemie, Institut für Anorganische Chemie, Universität zu Köln, Greinstraße 6, 50939 Köln, Germany
cEnviromental and Ressources Management Department, Quang Ninh Economic Zone Authority, Ha Long City, Vietnam
dDeutsches Elektronen-Synchrotron (DESY), 22607 Hamburg, Germany
First published on 4th January 2021
The clathrate-I borosilicide K8−xBySi46−y (0.8 ≤ x ≤ 1.2 and 6.4 ≤ y ≤ 7.2; space group Pmn) was prepared in sealed tantalum ampoules between 900 °C and 1000 °C. By high-pressure preparation at 8 GPa and 1000 °C, a higher boron content is achieved (x = 0.2, y = 7.8). Crystal structure and composition were established from X-ray diffraction data, chemical analysis, WDX spectroscopy, and confirmed by 11B and 29Si NMR, and magnetic susceptibility measurements. The compositions are electron-balanced according to the Zintl rule within one estimated standard deviation. The lattice parameter varies with composition from a = 9.905 Å for K7.85(2)B7.8(1)Si38.2(1) to a = 9.968(1) Å for K6.80(2)B6.4(5)Si39.6(5).
Fig. 2 Microstructure of sample 2 (cf.Table 1); back-scattered electron images. (Left) Polished clathrate grains (white) in a polymer matrix (black); boron inclusions appear as black spots within the white grains. (Right) Surface morphology of the as-grown sample. |
Composition from structure refinement | Composition from analysis | Preparation | |||||||
---|---|---|---|---|---|---|---|---|---|
No. | a/Å | Composition | n(K)/n(B) | n(K)/n(Si) | n(K)/n(B) | n(K)/n(Si) | Educts | Conditionsa | |
K:B:Si (at. %) | |||||||||
a Bam: amorphous boron; Bcryst: crystalline boron. b Preparation in an iron crucible | |||||||||
1 | 9.9366(3) | K7.18(2)B7.2(5)Si38.8(5) | 0.9972(20) | 0.1851(20) | WDXS | 0.79(10) | 0.181(2) | 15.4/24.6/60.0 | 900 °C |
CA | 1.048(6) | 0.1808(12) | 48 h; Bam | ||||||
2 | 9.9393(2) | K7.12(4)B7.1(6)Si38.9(6) | 1.003(3) | 0.183(3) | WDXS | 0.91(3) | 0.191(4) | 20.0/40.0/40.0 | 950 °C |
20 h; Bam | |||||||||
3 | 9.9470(2) | K6.98(4)B6.4(5)Si39.6(5) | 1.108(2) | 0.176(2) | WDXS | 0.90(3) | 0.185(2) | 17.9/14.3/67.9 | 1000 °Cb |
44 h; Bcryst | |||||||||
4 | 9.952(1) | K7.08(1)B6.8(3)Si39.2(3) | 1.0412(14) | 0.1806(14) | EDXS | — | 0.1707 [1] | 20.7/13.8/65.5 | 950 °C |
48 h; Bcryst | |||||||||
5 | 9.968(1) | K6.80(2)B6.4(5)Si39.6(5) | 1.063(2) | 0.172(2) | WDXS | 0.96(3) | 0.183(5) | 17.3/7.7/75.0 | 1000 °C |
CA | 1.161(13) | 0.1687(17) | 56 h; Bam | ||||||
6 | 9.9055(1) | K7.85(2)B7.8(1)Si38.2(1) | 1.01(3) | 0.204(5) | WDXS | 0.815(7) | 0.214(2) | 41.7/16.7/41.7 | 1000 °C |
5 h; Bam, 8 GPa |
Thermogravimetry experiments on a washed clathrate sample revealed an onset of continuous weight loss at ca. 870 °C. The sample was not molten a this temperature. The total amount is consistent with the complete elimination of potassium, while the residue showed the reflections of boron-doped α-Si in XRPD. For comparison, samples were heated in open Ta crucibles enclosed in silica glass ampoules for one day at various temperatures. Under these conditions, the decomposition was observed at similar temperatures, as evidenced by the reaction of potassium vapor with the glass vessel.
Occupancy refinement for the framework positions resulted in a distinctly reduced electron density for Si2, a minor reduction for Si3, and a RF value of 0.042. The ADP ratio for the framework positions did not change. The results reveal local disorder as the reason for the enhanced ADP of Si2 and Si3 positions and a mixed occupancy with Si and B atoms. The calculated residual density without occupancy of Si2 displayed a non-spherical distribution (Fig. 3, top left). When the Si2 position was occupied with a with a mixture of Si and B atoms in isotropic approximation, the refinement revealed residual density along the space diagonal (Fig. 3 top right), which was not removed by applying anisotropic ADP (Fig. 3, bottom left). Only by introducing two 16i split positions (Si + B), the refinement resulted in a ‘flat’ residual density map and a residual value of RF = 0.039. The occupancy of site Si3 was estimated in a similar fashion. The residual density calculated without atoms at this position revealed a non-spherical distribution in two directions – approximately along the diagonal in the (010) plane and perpendicular to it in (100) (Fig. 4a). Neither anisotropic approximation for ADPs for a single mixed occupied position (Fig. 4b and c) nor a model with two positions located in the (010) plane (Fig. 4d) yielded an acceptable description of the electron density in this region. However, it was satisfactorily described applying two silicon occupied split positions – one in the (010) plane (24k), and another one out of plane (48l) (Fig. 4e). Thereby, the residual value dropped to 0.031 (ESI, Table S4†). The final atomic coordinates and displacement parameters for all crystal structures K8−xBySi46−y, which were refined applying the same strategy, are listed in the (ESI, Tables S1–S6†).
Fig. 4 Distribution of the difference electron density around Si3 in two perpendicular planes: (a) without any atoms; (b) with one mixed occupied position in the (010) plane in isotropic approximation; (c) with one mixed occupied position in the (010) plane in anisotropic approximation; (d) with two mixed occupied positions in the (010) plane in isotropic approximation; (e) with two silicon occupied positions (one on the (010) plane, the other one out of plane, cf. ESI Table 5†); (f) position of the selected planes in the structure. The center of each panel is located at (0.30, 0.00, 0.12). The step of the isolines is 5 e Å−3 in (a) and 0.5 e Å−3 in all other panels. |
The preferred substitution of Si2 by B atoms at site 16i is a feature that only occurs for clathrate-I borosilicides so far. Typically, the replacement of group 14 elements in intermetallic clathrates by heteroatoms starts at site 6c (Si1). As in all binary clathrate silicides M8−xSi46 the Si2 atoms show the shortest framework distances,22,23 this site should be the most suitable one for boron atoms. However, the partial substitution at site 16i inevitably causes a structural disorder, because 16i atoms appear as bonded pairs. Assuming that direct contacts of negatively charged boron anions are energetically unfavourable, the pairs mainly consist of B–Si contacts in two orientations plus, for y < 8, a minority of Si–Si pairs. The bond distances d(B–Si) ≈ 2.0 Å and d(Si–Si) ≈ 2.3 Å differ substantially. The experimental electron density at sites 16i and 24k thus represents a sum of local configurations, which is reflected by the apparently large and anisotropic ADPs (Fig. 3 and 4). After introducing split positions for Si2 (16i1 + 16i2) the question arises, which of them is the favourable one for boron atoms (Fig. 5).
When boron occupies the split site 16i1, the neighbouring site 16i2 is occupied by silicon (Si22). In this case, all B–Si distances are favourably short: one to the silicon atom at 16i2, and three to the Si32 at 48l with values of ≈2.0 Å. Site 16i2 is less favourable for B atoms because of three longer distances of ca. 2.2 Å to the Si32 atoms. The minority case without boron atoms is represented by Si21–Si21 pairs. Here, the Si21 atoms are connected to three Si31 at site 24k. The Si22 atoms at 16i2 are connected to boron at 16i1, to Si31 atoms at 24k or to the Si32 atoms at 48l out of the mirror plane. To interpret the refined site occupancies, we extend the split-site model and consider the possible local configurations of the Si20−xBx dodecahedron around K1, which is composed of B21, Si21, Si22, Si31 and Si32 atoms (Fig. 6a–f).
Fig. 6 Local atomic arrangements derived from the Si3 split sites in the crystal structure of K8−xBySi46−y. The examples show how the Si20−xBx dodecahedra may respond to the composition. |
A frequently occurring situation, which cannot be explained in Fig. 5, is that the Si3 atom has two adjacent B atoms (Fig. 6a). Here, a shift towards Si32 is no longer possible, because the approach to one of the boron atom would enlarge the distance to the other one. In this case, a short distance to both boron atoms can still be realized by stretching the Si3–Si3 bond and shifting the pair at the same time towards the cage center (Fig. 6b, blue arrows). With equal distances to both boron atoms, such Si3 atoms contribute to the electron density at Si31 and not, as Fig. 5 may suggest, at Si32. Only in such cases, where the Si3 atoms are connected to a B atom and a Si atom (Fig. 6c and d), they shift towards the B atom and occupy the Si32 position. As a consequence, the Si3–Si3 bond line deviates from the [100] direction. This can even occur for a Si31–Si31 bond when the Si3 atoms are connected to a closer Si21 and a more distant Si22 atom (Fig. 6e and f). In the refined structure model, site Si31 represents all cases, for which the 24k atoms are connected to 16i atoms of the same type (Fig. 6b), while Si32 represents the asymmetrical local configuration (Fig. 6c). As the asymmetric arrangements occur more frequently, the Si32 site (48l) features a higher occupancy than Si31 (24k).
The crystal structure of the high-pressure product was refined from synchrotron X-ray powder diffraction data. The powder pattern (Fig. 7) was fully indexed with a primitive unit cell so that the structure model was developed in space group Pmn applying a similar refinement strategy as described above. The tetrakaidecahedral cages were found fully occupied with K2, while the K1 atoms in the smaller dodecahedral showed a minor deficiency. In the framework, position Si1 was fully occupied by silicon, but both Si2 and also Si3 showed mixed B/Si occupancy. However, the lower resolution of the method did not allow for resolving the split positions. Therefore, the bond distances represent mean values from the superposition of B–Si and Si–Si bonds. Remarkably, the refined composition K7.85(2)B7.8(1)Si38.2(1) fits the Zintl rule within one experimental error. Thermal analysis of the high-pressure product was similar to those of the ambient pressure products and did not show any exothermic decomposition effect on heating, which would have indicated a metastable phase.
The lattice parameter of the borosilicide clathrates with the remarkable minimum for K7.85(2)B7.8(1)Si38.2(1) (a ≈ 9.905 Å) is considerably smaller than that of the corresponding binary silicon clathrate K8−xSi46 (a ≈ 10.26 Å). The lattice parameter decreases with increasing boron content, which is expected from the short d(B–Si) distances (Fig. 8). Surprisingly, the decrease is not hindered by the increasing potassium content, which suggests an attractive interaction between the four-bonded boron anions and the K1 cations in the dodecahedral cages. So far, a decrease of lattice parameter with an increasing number of filler atoms has been observed only for the oversized Si28 cages in the clathrate-II structure of Na24−xSi136.25
Fig. 8 Number of potassium and boron atoms per unit cell of K8−xBySi46−y obtained from crystal structure refinement vs. lattice parameter. |
For compositions with partial occupancy of position K1, the crystal structure comprises empty and filled dodecahedral cages. Hence, an attractive interaction between K1 and B atoms would imply that the B atoms of B-Si22 pairs are oriented towards the K1 atoms. A complete separation into Si20 and K1@Si12B8 cages could be achieved for the hypothetical composition K7B8Si38 (Fig. 9, left). For the nearly filled composition K7.8B7.8Si38.2 a tetrahedral coordination of K1 by B atoms is most probable (Fig. 9, right). An ordered distribution of boron atoms may cause superstructures. For example, the ideal arrangement of B atoms derived for the compositions K7B8Si38 corresponds to space group Pm (Fig. 9, left), and for K8B8Si38 to space group P4n (Fig. 9, right). But so far, there is no evidence for a superstructure formation in our experiments. In the local structure, the distortions caused by short distances d(B–Si22) should favor arrangements with a uniform shortening of all four space diagonals. Moreover, the direct connection of silicon rich dodecahedra (Fig. 6f) is unfavorable due the very short distance Si21–Si31 (ESI, Table S4d†) which might also explain the existence of a lower limit for the boron content in K8−xBySi46−y.
In order to study the redistribution of the charges within the framework for different local arrangements, and the charge ratio between boron ad silicon atoms, the analysis of the calculated electron density was performed within the Quantum Theory of Atoms in Molecules.26 For both hypothetical models, the calculation reveals that the potassium atoms have nearly the same positive charge and transfer, thus, their valence electron to the framework. Rather unexpectedly, the distribution of the electrons within the framework does not completely follow the Zintl count (Fig. 10). The charges of the four-bonded silicon atoms deviate from the expected zero value and are between −0.52 and +0.55 in model 1 and between −0.09 and +0.67 in model 2. Independently from the effective silicon charges, boron atoms have more negative charges as expected from the Zintl count and electronegativity.
Fig. 10 QTAIM charges in K8B8Si38 models 1 (top) and 2 (bottom) with different distributions of boron and silicon atoms at the Si2 position. |
Fig. 11 NMR spectra (static echo measurements) of the clathrates with composition K7.18(2)B7.2(5)Si38.8(5) (blue), K6.98(4)B6.4(5)Si39.6(5) (green) and K6.80(2)B6.4(5)Si39.6(5) (red). (Left) 11B NMR signals are sharp and slightly asymmetric. The broad background is attributed to the presence of amorphous boron inclusions. (Right) 29Si NMR signals (static echo measurements) show a small Knight shift typical for widely electronically balanced silicon clathrate-I compounds.28–30 |
By using echo measurements, contributions of amorphous boron appearing as a broad background signal were separated. For the quantitative analysis of the boron content, the samples were measured at standardized conditions. The integrated intensity of the 11B NMR signals was normalized by the nominal sample weight as the clathrate content in the bulk samples was always close to 100%. The results confirm the range of boron content found by X-ray diffraction (Table 9, ESI†). The single, sharp signal points to only one dominating local environment of four-bonded boron atoms. Therefore, the presence of B–B bonds besides B–Si bonds at site 16i is ruled out. The slight asymmetry in the 11B signals is explained by the differences in bond angles, bonding distances and local symmetry due to the different connection patterns of the Si–B pairs (Fig. 5 and 6). 29Si NMR spectroscopy reveals a broad signal, which does not allow for an assignment of individual contributions of framework sites (Fig. 11, right). The signals have a smaller Knight shift than Ba8−xSi46 or Na8Si46.27,31 This indicates bad-metal behavior of the clathrate phase for all samples, which is in agreement with electronically widely (but not exactly) balanced chemical compositions.28–30
High-pressure preparation started from a finely ground mixture of K4Si4 and amorphous boron powder with atomic ratio K:B:Si = 5:2:5. The powder was mechanically closed in a boron nitride crucible (d = 3 mm) and plugged in the drilled hole of a MgO octahedron (l = 18 mm). The synthesis was conducted using a multi-anvil press comprising a Walker-type module.35 Before the experiment, pressure and temperature measurements were calibrated by recording resistance changes of bismuth and thermocouple-calibrated runs, respectively. A pressure of at p = 8(±1) GPa was applied, and the sample was heated to T = 1273(±127) K within 15 min. After annealing for 60 min, the sample was quenched under load. To remove side products, the sample was first washed with ethanol, then with deionized water and finally with acetone, and dried at room temperature. The high-pressure product is air-stable and inert against strong acids and bases.
Elemental analysis. The clathrate phase is stable against aqua regia and NaOH solutions. Samples were dissolved in aqueous HNO3/HF by using a microwave-assisted procedure (ETHOS, MLS) in closed Teflon vessels and analyzed by using optical emission spectrometry (ICP-OES, VISTA RL, Varian). Standardization was performed with a matrix-matched standard. For determination of O and H in amorphous boron, specimens of about 25 mg were loaded into tin capsules and analyzed by carrier gas hot extraction with IR spectrometry of CO, CO2, and H2O (TCH 600, LECO). The carbon content was analyzed after the combustion of the sample in oxygen stream (CHLH 200, LECO).
Powder X-Ray diffraction (PXRD). Diffraction experiments on powder samples were performed with a Guinier camera (Huber G670, Cu Kα1 radiation, λ = 1.54056 Å, germanium monochromator, 5° ≤ 2θ ≤ 100°, Δ2θ = 0.005). Reflection positions were corrected by using LaB6 standard (NIST), and the unit cell parameters were calculated from least-square refinement. Rietveld refinements were performed using synchrotron data (Desy Hamburg, PETRA III, Beamline P02.1, λ = 0.20720 Å) recorded at room temperature. All calculations were performed with the WinCSD software.36
X-ray single crystal diffraction. Five single crystals obtained from samples with different lattice parameters were investigated by single-crystal X-ray diffraction. The crystals were selected under paraffin oil and fixed onto a glass capillary. The measurements were performed on a IPDS diffractometer (Stoe, MoKα radiation, λ = 0.71073 Å), a CAD4 diffractometer (Enraf-Nonius, Mo Kα radiation) or a Rigaku Spider diffractometer (rotating anode and Varimax optics, AgKα radiation, λ = 0.560871 Å). Absorption correction was performed with a multi-scan procedure. The crystal structures were refined using WinCSD software.36 Details concerning the data collection, structure refinement, and interatomic distances are given in the ESI.†
Scanning electron microscopy (SEM). Bulk samples were embedded in epoxy resin with conductive carbon filler and polished. Energy-dispersive X-ray spectroscopy (EDXS) was performed with an attached EDAX Si (Li) detector, wavelength dispersive X-ray spectroscopy (WDXS) by using a Cameca SX100 electron microprobe. The Kα lines of the elements were measured and evaluated using Ni3B, Mg2Si, and KBr as standards.
Thermogravimetry (TG). The thermal stability of the clathrate phase was investigated using a thermo balance (Netzsch STA 409 CD). The substance was filled in a Ta crucible and heated with a rate of 10 K min−1 up to 1200 °C.
Magnetic susceptibility. Specimens of m = 50 mg–90 mg were measured in closed silica tubes using a SQUID magnetometer (MPMS XL-7, Quantum Design) at external fields of 3.5 T and 7 T. The diamagnetic contribution of the silica tube was determined prior to the measurements and subtracted. The samples contained tiny amounts of ferromagnetic impurities with a mass content of about 1 ppm, which may originate, e.g., from the usage of steel tools in sample preparation. Therefore, an extrapolation to infinite external field was performed by applying the Honda-Owen method.37 Afterward, the temperature-independent contribution was extracted by a polynomial fit.
Nuclear Magnetic Resonance Spectroscopy. NMR experiments were performed with a Bruker Avance 500 spectrometer in a magnetic field of B0 = 11.74 T. A standard Bruker Magic Angle Spinning (MAS) probe for 2.5 mm ZrO2 rotors was used for spinning experiments while the static experiments were performed in probes built by NMR Service GmbH, Erfurt. The external reference frequencies for 11B and 29Si nuclei were 160.458 MHz and 99.360 MHz, corresponding to the signals of BF3·Et2O and TMS solutions in CCl3D, respectively. In the case of 11B, the signal was collected either after a single pulse or as an echo after two pulses of equal length (6 μs) applying a recovery time of 30 s–60 s. The single pulse experiments were performed for signal assignment, while the quantitative evaluation bases on the echo measurements. In the case of 29Si, Hahn echoes were obtained after a pulse sequence, in which the second pulse had twice the length of the first one (1.8 μs and 3.6 μs), applying a recovery time of 10 s.
Chemical bonding. For the electronic structure calculations, the TB-LMTO-ASA software was used.38 Analysis of the chemical bonding is performed by the electron localizability approach in position space.39 The electron localizability indicator (ELI) in its ELI-D representation40 is calculated together with the electron density (ED), using a specialized module implemented in the TB-LMTO-ASA package. The topology of the three-dimensional distributions of ELI-D and ED was evaluated with the program DGrid.41 Integration of the electron density in the basins bounded by zero-flux surfaces of the electron density or ELI-D gradient fields yield the atomic charges or bond populations, respectively. This procedure follows the quantum theory of atoms in molecules (QTAIM).26
Footnote |
† Electronic supplementary information (ESI) available: CSD numbers: High-pressure sample K7.85(2)B7.8(1)Si38.2(1), CSD 2006316; crystal 1: K7.18(2)B7.2(5)Si38.8(5), CSD 2046329; crystal 2: K7.12(4)B7.1(6)Si38.9(6), CSD 2046333; crystal 3: K6.98(4)B6.4(5)Si39.6(5), CSD 2046330; crystal 4, K7.08(1)B6.8(3)Si39.2(3), CSD 2046332; crystal 5: K6.80(2)B6.4(5)Si39.6(5), CSD 2046331. CCDC 2006316–2046333. For ESI and crystallographic data in CIF or other electronic format see DOI: 10.1039/d0dt03339a |
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