Issue 22, 2023

The quantitative contribution of interfacial coexisting Mn and O vacancies to MnO2 photocatalytic degradation of phenol

Abstract

Vacancy engineering is an important means to improve the catalytic performance of photocatalysts. Both VMn and VO can promote photocatalytic and thermocatalytic reactions of MnO2 catalysts. From the point of view of reducing energy consumption, photocatalysis has incomparable advantages over thermocatalysis. Meanwhile, in-depth investigation of the relative contribution of VMn and VO on the photocatalytic reaction was not concluded yet. In this paper, VMn-1 and VMn-2 (with different levels of manganese vacancies (VMn)) and VMn,O (with both VMn and oxygen vacancies (VO)) were synthesized to investigate the relative contributions of VMn and VO in the photocatalytic process by MnO2. The catalysts were characterized by EDS, ICP, and XPS to explore their structures and the concentrations of VMn and VO. The contributions to phenol degradation were calculated to be 487 321.43 (mg L−1) phenol per mol VMn and 125 917.16 (mg L−1) phenol per mol VO for 2 h irradiation under 400 mW cm−2 visible light. Density-functional theory (DFT) calculations were performed to explain the different contributions of VMn and VO. The higher contribution of VMn is attributed to its induced formation of a continuous band gap on the (001) crystal surface, which is favourable for visible light absorption and carrier transport. This study provides theoretical guidance and research direction for the design of efficient photocatalysts using vacancy engineering.

Graphical abstract: The quantitative contribution of interfacial coexisting Mn and O vacancies to MnO2 photocatalytic degradation of phenol

Supplementary files

Article information

Article type
Paper
Submitted
21 Jul 2023
Accepted
20 Sep 2023
First published
21 Sep 2023

Catal. Sci. Technol., 2023,13, 6480-6489

The quantitative contribution of interfacial coexisting Mn and O vacancies to MnO2 photocatalytic degradation of phenol

Y. Zhou, X. Lei, D. Yan, J. Ye, B. Deng and W. Xu, Catal. Sci. Technol., 2023, 13, 6480 DOI: 10.1039/D3CY01005H

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