Selective detection of trace amount of Cu2+ using semiconductor nanoparticles in photoelectrochemical analysis

Guang-Li Wang; Jing-Juan Xu; Hong-Yuan Chen

doi:10.1039/C0NR00084A

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Selective detection of trace amount of Cu²⁺ using semiconductor nanoparticles in photoelectrochemical analysis†

Guang-Li Wang,^a Jing-Juan Xu*^a and Hong-Yuan Chen^a

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* Corresponding authors

^a Key Laboratory of Analytical Chemistry for Life Science (Ministry of Education of China), School of Chemistry and Chemical Engineering, Nanjing University, Nanjing, China
E-mail: xujj@nju.edu.cn
Fax: +86-25-83597294
Tel: +86-25-83597294

Abstract

A highly sensitive and selective photoelectrochemical sensor for Cu²⁺ was developed based on the selective interaction between CdS quantum dots (QDs) immobilized on an indium tin oxide (ITO) electrode surface and Cu²⁺ in a triethanolamine (TEA) solution to form Cu_xS-doped CdS QDs, which disrupts the electron transfer from the conduction band of CdS to ITO and results in a decrease of photocurrent.

This article is part of the themed collection: Doped nanostructures

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Article information

DOI: https://doi.org/10.1039/C0NR00084A
Article type: Communication
Submitted: 04 Feb 2010
Accepted: 11 Mar 2010
First published: 07 May 2010

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Nanoscale, 2010,2, 1112-1114

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Selective detection of trace amount of Cu²⁺ using semiconductor nanoparticles in photoelectrochemical analysis

G. Wang, J. Xu and H. Chen, Nanoscale, 2010, 2, 1112 DOI: 10.1039/C0NR00084A

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