Detailed product analysis during the low temperature oxidation of n-butane†
Abstract
The products obtained from the low-temperature oxidation of
* Corresponding authors
a
Laboratoire Réactions et Génie des Procédés, CNRS, Nancy Université, ENSIC, 1, rue Grandville, BP 20451, 54001 Nancy Cedex, France
E-mail:
Frederique.Battin-Leclerc@ensic.inpl-nancy.fr
Fax: 33 3 83 37 81 20
Tel: 33 3 83 17 51 25
b National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, P. R. China
The products obtained from the low-temperature oxidation of
O. Herbinet, F. Battin-Leclerc, S. Bax, H. L. Gall, P. Glaude, R. Fournet, Z. Zhou, L. Deng, H. Guo, M. Xie and F. Qi, Phys. Chem. Chem. Phys., 2011, 13, 296 DOI: 10.1039/C0CP00539H
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