Issue 83, 2014

Fluorinated silsesquioxane-based photoresist as an ideal high-performance material for ultraviolet nanoimprinting

Abstract

In this study, we developed a new kind of functional photoresist based on octamethacrylated polyhedral oligomeric silsesquioxane (MAPOSS) and fluorinated monomer as an ideal material for ultraviolet nanoimprint lithography (UV-NIL). We first optimized the synthesis of MAPOSS using the hydrolysis and condensation reactions of methacryloyl oxygen propyl trimethoxysilane. The hybrid photoresist formulations with MAPOSS and fluorinated additive were found to be effective materials for high-performance UV-NIL, which exhibited a preferable curing rate, Young's modulus and thermal stability. Additionally, the low shrinkage and low surface energy of the curing film allows for easier transfer of relief features with excellent imprint reliability for UV-based NIL techniques. These characteristics of fluorinated silsesquioxane-based photoresists make them suitable as inexpensive and convenient components in UV-NIL processes.

Graphical abstract: Fluorinated silsesquioxane-based photoresist as an ideal high-performance material for ultraviolet nanoimprinting

Supplementary files

Article information

Article type
Paper
Submitted
20 Jun 2014
Accepted
04 Sep 2014
First published
05 Sep 2014

RSC Adv., 2014,4, 44073-44081

Author version available

Fluorinated silsesquioxane-based photoresist as an ideal high-performance material for ultraviolet nanoimprinting

G. Lin, F. Zhang, Q. Zhang, J. Wei and J. Guo, RSC Adv., 2014, 4, 44073 DOI: 10.1039/C4RA06022A

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