Single-crystal structure determination from microcrystalline powders (∼5 μm) by an orientation attachment mountable on an in-house X-ray diffractometer

Abstract

An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. Single-crystal diffraction data are acquired in situ and analyzed using conventional computer software to determine the crystal structure of the microcrystals. The performance of the attachment is demonstrated using L-alanine microcrystals (∼5 μm).