Issue 104, 2016, Issue in Progress

Synthesis of Cu and Ni chalcogenides and evaluation of their properties for electromagnetic wave absorption

Abstract

Cu and Ni chalcogenides were synthesized by hydrothermal methods and characterized by XRD and SEM. Their properties on electromagnetic (EM) wave absorption were evaluated by a vector network analyzer with a coaxial measurement. For the Cu7.2S4 and Cu2Se–paraffin systems, the peak for minimum reflection loss (RL) shifted from high frequency to low frequency as the thickness increases. At a thickness of 1.6 mm, the Cu7.2S4–paraffin composite could achieve a RL value of −36.60 dB at the absorption peak frequency (APF) of 17.2 GHz with a bandwidth of 6 GHz for RL < −10 dB. For the Cu2Se–paraffin composite, the RL value, APF, and bandwidth were −27.5 dB, 11.76 GHz, and 3 GHz, respectively, at a thickness of 1.5 mm. For the NiO, NiS, and NiSe–paraffin composite systems, the APF for minimal RL moved from high to low frequency as the thickness increases, too. The NiO–paraffin had a RL of −12.68 dB at the APF of 12.8 GHz when the thickness of the sample was 2 mm. For the NiS–paraffin composite, the RL value, APF, and bandwidth were −31.93 dB, 7.52 GHz, and 2 GHz, respectively, with a thickness of 3 mm, while the NiSe–paraffin composite had a RL value, APF, and bandwidth of −41.22 dB, 8.24 GHz, and 1.6 GHz, respectively, with a thickness of 2.2 mm. All Cu and Ni chalcogenides had excellent EM reflection loss, enabling them to be excellent microwave absorbing materials. And most importantly, our results were the first to report superior EM absorption properties for selenides.

Graphical abstract: Synthesis of Cu and Ni chalcogenides and evaluation of their properties for electromagnetic wave absorption

Article information

Article type
Paper
Submitted
25 Aug 2016
Accepted
20 Oct 2016
First published
21 Oct 2016

RSC Adv., 2016,6, 102472-102481

Synthesis of Cu and Ni chalcogenides and evaluation of their properties for electromagnetic wave absorption

M. Liu, G. Lv, G. Chen, Y. Qin, P. Sun, K. Zhou, X. Xing and C. He, RSC Adv., 2016, 6, 102472 DOI: 10.1039/C6RA21341C

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