Issue 11, 2019
From the journal:

Nanoscale

Measurement of nanomechanical properties of DNA molecules by PeakForce atomic force microscopy based on DNA origami†

Lin Li,‡a   Ping Zhang,‡bc   Jiang Li, ORCID logo ‡bd   Ying Wang,bd   Yuhui Wei,bd   Jun Hu,bd   Xingfei Zhou,*ae   Bingqian Xu*e  and  Bin Li ORCID logo *bd  

* Corresponding authors

a School of Science, Ningbo University, Ningbo 315211, Zhejiang, China
E-mail: zhouxingfei@hotmail.com

b Division of Physical Biology & Bioimaging Center, Shanghai Synchrotron Radiation Facility, Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
E-mail: libin@sinap.ac.cn

c University of Chinese Academy of Sciences, Beijing 100049, China

d Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China

e Single Molecule Study Laboratory, College of Engineering, University of Georgia, Athens, Georgia 30602, USA
E-mail: bxu@engr.uga.edu

Abstract

Characterization of the stiffness of thin DNA strands remains difficult. By constructing bilayer DNA molecules, we investigated their mechanical properties using AFM. Increased DNA thickness through DNA origami greatly reduced the substrate effect when measuring Young's modulus, thus providing a more accurate picture of the inherent nanomechanical properties of DNA.

Graphical abstract: Measurement of nanomechanical properties of DNA molecules by PeakForce atomic force microscopy based on DNA origami

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Article information

DOI
https://doi.org/10.1039/C8NR10354B
Article type
Communication
Submitted
22 Dec 2018
Accepted
19 Feb 2019
First published
20 Feb 2019

Nanoscale, 2019,11, 4707-4711

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Measurement of nanomechanical properties of DNA molecules by PeakForce atomic force microscopy based on DNA origami

L. Li, P. Zhang, J. Li, Y. Wang, Y. Wei, J. Hu, X. Zhou, B. Xu and B. Li, Nanoscale, 2019, 11, 4707 DOI: 10.1039/C8NR10354B

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