Economically detaching transparent and flexible (Al,Ga)N nanowire films with improved photoelectric response in view of ultraviolet photodetectors†
Abstract
Gallium nitride-based (GaN-based) nanowire films are promising for various devices requiring high flexibility and/or high transparency, such as detectors and wearable intelligent electronics. In this work, a cost-effective and novel electrochemical procedure has been designed to detach films with (Al,Ga)N nanowires (NWs). Besides the ability of selectively etching, the nitric acid (HNO3) is found to protect the (Al,Ga)N NWs without too much etching, which is better than the potassium hydroxide (KOH). Therefore, a film comprising a dense ensemble of (Al,Ga)N NWs with both good flexibility and high transparency can be achieved successfully by this lift-off technology. In addition, it is demonstrated that the HNO3 etching can improve the photoelectric response of ultraviolet (UV) photodetectors significantly. Compared to that of UV photodetectors without HNO3 etching, the peak responsivity of UV photodetectors with HNO3 etching is enhanced by about 166% and the corresponding decay time becomes much faster. The removal of the bottom aluminium nitride (AlN) layer and Al-rich (Al,Ga)N shell, as well as the decrease of the surface states and defects can contribute to the improvements.