Issue 11, 2023
From the journal:

Journal of Materials Chemistry C

Correction: Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications

Xinchuan Liu,ab   Yuanxun Li,bd   Jianfeng Xiao,ab   Jiuzhou Zhao,b   Chi Li*be  and  Zhenjun Li*bce  

* Corresponding authors

a School of Materials Science and Engineering, Zhengzhou University, Zhengzhou 450001, China

b CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China
E-mail: lizhenjun@nanoctr.cn, lichi@nanoctr.cn
Tel: +86 10 82545609

c The GBA National Institute for Nanotechnology Innovation, Guangdong, Guangzhou 510700, China

d School of Instrument Science and Engineering, Southeast University, Nanjing 210096, China

e Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China

Abstract

Correction for ‘Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications’ by Xinchuan Liu et al., J. Mater. Chem. C, 2023, 11, 2505–2513, https://doi.org/10.1039/d2tc04363g.

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Article information

DOI
https://doi.org/10.1039/D3TC90041J
Article type
Correction
Submitted
15 Feb 2023
Accepted
15 Feb 2023
First published
06 Mar 2023
This article is Open Access
Creative Commons BY license

J. Mater. Chem. C, 2023,11, 3890-3890

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Correction: Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications

X. Liu, Y. Li, J. Xiao, J. Zhao, C. Li and Z. Li, J. Mater. Chem. C, 2023, 11, 3890 DOI: 10.1039/D3TC90041J

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