Correction: Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films

Siyu Isaac Parker Tian; Zekun Ren; Selvaraj Venkataraj; Yuanhang Cheng; Daniil Bash; Felipe Oviedo; J. Senthilnath; Vijila Chellappan; Yee-Fun Lim; Armin G. Aberle; Benjamin P. MacLeod; Fraser G. L. Parlane; Curtis P. Berlinguette; Qianxiao Li; Tonio Buonassisi; Zhe Liu

doi:10.1039/D4DD90015D

Correction: Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films

Siyu Isaac Parker Tian,^ab Zekun Ren,^ab Selvaraj Venkataraj,^b Yuanhang Cheng,^b Daniil Bash,^c Felipe Oviedo,^d J. Senthilnath,^e Vijila Chellappan,^c Yee-Fun Lim,^cf Armin G. Aberle,^b Benjamin P. MacLeod,^g Fraser G. L. Parlane,^g Curtis P. Berlinguette,^g Qianxiao Li,^h Tonio Buonassisi*^ad and Zhe Liu*^ad

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* Corresponding authors

^a Low Energy Electronic Systems (LEES), Singapore-MIT Alliance for Research and Technology (SMART), 1 Create Way, Singapore 138602, Singapore
E-mail: zhe.liu@nwpu.edu.cn, buonassi@mit.edu

^b Solar Energy Research Institute of Singapore (SERIS), National University of Singapore, 7 Engineering Drive, Singapore 117574, Singapore

^c Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Singapore 138634, Singapore

^d Department of Mechanical Engineering, Massachusetts Institute of Technology (MIT), 77 Massachusetts Ave., Cambridge, MA 02139, USA

^e Institute for Infocomm Research (I2R), Agency for Science, Technology and Research (A*STAR), 1 Fusionopolis Way, Singapore 138632, Singapore

^f Institute of Sustainability for Chemicals, Energy and Environment, Agency for Science, Technology and Research (A*STAR), 1 Pesek Rd, Singapore 627833, Singapore

^g Department of Chemistry, The University of British Columbia (UBC), 2036 Main Mall, Vancouver, Canada

^h Department of Mathematics, National University of Singapore (NUS), 21 Lower Kent Ridge Rd, Singapore 119077, Singapore

Abstract

Correction for ‘Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films’ by Siyu Isaac Parker Tian et al., Digital Discovery, 2023, 2, 1334–1346, https://doi.org/10.1039/D2DD00149G.

Digital Discovery

Correction: Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films

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Correction: Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films

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