Self-absorption correction of NEXAFS spectra for intermediate sample thicknesses applied to organo-sulfur model compounds

Abstract

Near-Edge X-ray Absorption Fine Structure (NEXAFS) spectra tend to be damped due to self-absorption effects when measured in fluorescence-yield mode in samples which are neither thin nor dilute. While established self-absorption correction methods are only valid for infinitely thick samples and partly inapplicable if the samples are too concentrated, the novel forward correction presented here is widely applicable, especially for intermediately thick and concentrated samples. Aiming towards quantitative analysis supporting the development of lithium sulfur battery materials, which are intermediately thick and not dilutable, the forward correction is applied to organo-sulfur liquid films as a proof of concept.