Atomic Force Microscopy as a Multimetrological Platform for Energy Devices

Abstract

In this article, we present a comprehensive study utilizing Atomic Force Microscopy (AFM) as a multimetrological platform for the characterization of novel energy harvesting devices, with a particular focus on optical nanomaterials - nanowires. Despite their challenging structure, AFM offers exceptional versatility in probing dimensional and functional properties of nanowires at the nanoscale. We demonstrate the capabilities of AFM measurements to provide an extensive understanding of the structural, electrical, and spectroscopic properties of nanowires using different operational modes, including Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), and Conductive-AFM (C-AFM). Our findings establish AFM as an invaluable metrological tool for the development of cutting-edge energy harvesting technologies and optical nanomaterials.