Pablo F.
Betancur
a,
Omar E.
Solis
a,
Rafael
Abargues
a,
Teresa S.
Ripolles
a and
Pablo P.
Boix
*b
aInstituto de Ciencia de los Materiales de la Universidad de Valencia (ICMUV), Paterna, 46980, València, Spain
bInstituto de Tecnología Química, Universitat Politècnica València-Consejo Superior de Investigaciones Científicas, Av. dels Tarongers, 46022, València, Spain. E-mail: pablo.p.boix@itq.upv.es
First published on 25th November 2024
Perovskite solar cells (PSCs) have demonstrated remarkable advancements in efficiency and stability, yet fully understanding the dynamic processes governing their performance remains a challenge. Impedance spectroscopy (IS) offers a powerful means to characterize PSCs over a wide range of time scales, revealing insights into the internal electronic and ionic processes. However, critical factors like recombination, charge extraction, and transport resistance are often coupled in the same spectra response, affecting their accurate identification. This study explores the use of the j–V curve reconstruction as a tool to identify when recombination governs the impedance response. Our findings show that recombination resistance can be accurately identified, regardless of the underlying recombination mechanism, in the solar cells with unhindered charge extraction. Conversely, in devices with hindered charge extraction, the IS fitting struggles to decouple the transport, extraction and recombination processes, resulting in inaccurate j–V reconstructions. These findings emphasize the importance of accurately identifying the physical processes influencing IS spectra to improve diagnostics and device performance in PSC technologies.
Impedance spectroscopy (IS) provides a non-destructive approach to address these limitations. It is a powerful technique that enables the electrical characterization of devices at any steady state (fixing the illumination and DC voltage conditions) of the j–V curve across a wide range of time scales, shedding light on the internal processes of the PSCs.4,5 In a typical impedance measurement, a small frequency-modulated (AC) signal is applied around a fixed (DC) voltage bias. The subsequent AC current response is then measured, allowing the extraction of frequency-dependent data in the complex plane. This provides an insight into the internal mechanisms of the device across different temporal ranges. Due to this capability, IS could be used to decouple different processes that occur with designable kinetics, such as rapid electronic movement or slower ion migration and electrochemical reactions within the bulk material or at interfaces.6 IS has been widely used in other systems like batteries, organic and dye-sensitized solar cells.7–11 However, the IS data interpretation for the case of PSCs remains as topic of discussion in the scientific community. The clear identification of different features in the Nyquist plot with specific device processes can be ambiguous, hindering the use of the technique as a pragmatical analysis tool. The vast majority of IS spectra from PSC consist of distinct high frequency (HF) and low frequency (LF) features well separated in the form of two arches,6 bringing a common baseline to examine the data.
The implementation of equivalent circuit models (ECMs) is one of the most common approaches to analyze IS data. ECMs simplify complex systems into manageable models composed of basic electrical components. Although it is not strictly necessary to work with an ECM for the physical analysis, successfully fitting the data to an appropriate ECM ensures that it complies with the linear response criterion and contributes to confirm its validity as an IS spectra. From a qualitative point of view, different ECMs can reproduce the same spectra, highlighting the importance of working with accurate simplified models whose parameters correspond to the physical processes that determine the experimental IS response. Avoiding overparameterization is crucial, as it can lead to unreliable data interpretations. Detailed reviews of different ECMs implemented for PSCs6,12,13 analyze the common elements between them, and the various approaches when more complex features appear in the response. Among these, an ECM based on a parallel coupling of the ionic and electronic phenomena,14 derived from a phenomenological approach, can model the particularities of PSCs. This ECM consists of a series resistance (Rs) associated with the electrodes and wiring resistance, the geometrical capacitance (Cg) showcased at the high frequency regime related to the dielectric properties of the perovskite, a resistor (Rrec+tr) that couples both the recombination and transport/injection resistances, in parallel with a low frequency branch formed by a pair of resistance (Rion) and capacitance (Cion) related to the ionic nature of the perovskite and charge accumulation at the interfaces. This model has been widely employed to analyze different PSC systems,15–19 as it simplifies the interpretation of the impedance spectral features and provides a unified framework for comparing the data reported in the literature.
Nevertheless, even with an adequate ECM, obtaining relevant parameters that reproduce the IS response of PSCs can be challenging. The dominance of the low geometric capacitance and high ion-related capacitance result in the coupling of charge transport, extraction, and recombination phenomena and their associated resistances.11 These competing processes that ultimately govern the overall performance of PSCs are coupled in the spectral response, and subsequently in the parameter Rrec+tr of the previously discussed model. In highly efficient PSCs, this coupling does not represent a problem because the charge transport and extraction processes can be negligible for the cell behavior. However, as these processes get hampered, their coupling with the recombination resistance becomes an issue. Thus, it is crucial to find strategies to corroborate the physical meaning behind the resistances in the ECM and their relationship with the j–V characteristic of the devices. There are several techniques such as external quantum efficiency,20 bias-dependent photoluminescence imaging,21 and transient photovoltage techniques22–24 which indirectly allow the reconstruction or prediction of the j–V curve in photovoltaic devices. This is especially helpful in tandem solar cells systems, where the j–V characteristic of the individual sub-cells is typically not directly measurable. Beyond the academic interest of reconstructing the j–V curve from various experimental data, this method serves as a useful tool for interpreting complex measurements with challenging data interpretation.
Here, we present a simple method to determine if the recombination resistance (Rrec) is the dominant component of the Rrec+tr parameter extracted from the ECM analysis of the IS response. We evaluate four different PSCs cases (optimal, highly recombinative buried interface, low interfacial recombination with hindered extraction, and high interfacial recombination with hindered extraction) to assess when the calculated Rrec+tr allows to reconstruct the j–V curve, and therefore depicts the real Rrec. In the cases of unhampered charge extraction, the resistive parameter of the IS can be used to fully reproduce the j–V characteristics under different illuminations. This confirms the recombinative nature of the Rrec+tr parameter in these cases.
Device | V oc (V) | J sc (mA cm−2) | FF (%) | PCE (%) |
---|---|---|---|---|
MeO-2PACz/C60 | 1.09 | 20.66 | 76.86 | 17.42 |
PEDOT:PSS/C60 | 0.80 | 20.63 | 83.57 | 13.87 |
MeO-2PACz/ICBA | 1.06 | 11.40 | 21.00 | 2.65 |
PEDOT:PSS/ICBA | 0.83 | 1.91 | 19.78 | 0.32 |
(i) MeO-2PACz/CsMAFA/C60: optimized device with 17% PCEs and Voc of 1.1 V. The implementation of self-assembled monolayers such as MeO-2PACz have been reported to promote a fast hole extraction, reducing non-radiative recombination at the hole-selective interface.27 This configuration is used to evaluate parameters for highly efficient devices. The conduction band energy of C60 (∼−4.2 eV28,29) is a well fit to the CsMAFA, which value has been reported around −4.0 eV.30
(ii) PEDOT:PSS/CsMAFA/C60: this configuration was chosen to promote a scenario with high recombination. The highly doped nature of the PEDOT:PSS leads to a strong interfacial recombination between the HTM and the absorber, as reported in the literature.31,32 In the devices studied, this is reflected by a reduction of the PCE to 13% and Voc to 0.8 V.
(iii) MeO-2PACz/CsMAFA/ICBA, and (iv) PEDOT:PSS/CsMAFA/ICBA: the implementation of ICBA as ETM aims to induce a hindered charge extraction in a system with low (case iii) and high (case iv) surface recombination. The conduction band of the ICBA (−3.7 eV33,34) presents higher energy compared to the CsMAFA (∼−4.0 eV). This mismatch in the band energy alignment explains the lack of rectification in the j–V curve (Fig. 1(a)) and the overall charge extraction problem of this devices with PCEs under 3%.
The j–V curves measured before and after the IS are shown in Fig. S2 (ESI†). In the first two cases (i) and (ii), the devices do not exhibit significant degradation after measurement, except for an increase in hysteresis with the use of PEDOT:PSS. With the addition of ICBA as ETM (iii) and (iv), differences are observed between the pre-IS and post-IS j–V curves. However, for all cases, the current values during IS remain stable and closely match the reverse j–V curve measured post-IS. This confirms that the devices are analyzed near steady-state condition, minimizing the impact of degradation or system instability. Fig. 1(b) and (c) show the Nyquist plots resulting from the IS measurements at Voc and Jsc conditions, which consistently display a qualitatively similar pattern. They reproduce the characteristic shape of the PSCs IS spectra, which consists of one arch at the HF regime and one at the LF regime, and both are well distinguished in all cases regardless of the performance of the device. This showcases that even when charge extraction is hampered, the absorber remains the main contributor to the Nyquist shape in our cases. Thus, the correct identification of the specific physical phenomenon behind these features becomes critical. The IS measurements for the ICBA-based devices result in spectra with relatively large values of Z′ at low frequencies. Note that, while this is classically interpreted as an improved recombination resistance, the Voc values of the PEDOT:PSS/ICBA devices do not support this claim. Additionally, these large Z′ spectra for the ICBA samples display relatively lower bias dependance, as can be seen in Fig. S3 (ESI†). This unusual behavior is in accordance with the inefficient charge extraction of these devices. The corresponding Bode plots for all cases are depicted in Fig. S4 (ESI†).
The ECM described in the introduction section can be employed as a tool to fit the data and analyze the impedance patterns. The extracted values of each parameter are plotted in Fig. 2, with a schematic representation of the ECM shown in the inset of Fig. 2(a). Among these parameters is the geometrical capacitance (Cg) which dominates the HF regime. Cg primarily depends on the nature and thickness of the absorber material and represents a typical and expected behavior for PSC. Accordingly, it presents a constant value around 10−8 F cm−2 through the different voltages for all samples, as expected for the unaltered thicknesses of all the device stacks. Using Cg and the measured perovskite thickness (500 nm) to estimate the dielectric permittivity of the material, we obtain an average value of 30, which aligns with other values reported for mixed perovskites.35–38
Fig. 2 (a), (c) Capacitive and (b), (d) resistive elements as extracted from the fittings of the impedance spectra under 0.1 sun. The inset in (a) shows the ECM implemented. |
A prominent influence of the ionic nature is typically observed in the LF regime response of PSCs, reflected in the Cion and Rion parameters of the employed ECM. The behavior of these parameters strongly depends on the primary recombination mechanism,13 as suggested by drift-diffusion simulation models. However, it cannot not directly quantify the recombination process. The presence of negative hooks or negative capacitances in the Nyquist plots are a well-documented phenomena in PSC.39–42 Inductive loops, whether positive or negative, may arise due to the kinetic delay in ionic charge buildup at the interface, which can be explained by a surface polarization model.43
In systems dominated by bulk recombination, low ion vacancy density combined with low electronic diffusion coefficient can produce negative Rion values, which also translate into negative hooks on the Nyquist plot.
In our study, this model aligns well with the experimental observations captured on the spectra, particularly close to open circuit conditions. For instance, PEDOT:PSS-based devices are strongly affected by surface recombination and do not exhibit negative hooks, unlike MeO-2PACz-based devices (Fig. S3, ESI†). These hooks can be a signal of higher influence of bulk recombination processes for the latter, related to an improved HTM/perovskite interface, regardless of the analyzed electron transport material. In this line, self-assembled monolayers such as MeO-2PACz have been reported to promote a fast hole extraction, reducing non-radiative recombination at the interface,27 which supports the dominance of bulk recombination in these cases. Additionally, following the drift diffusion studies, the parameters determined by ionic effects should not change significantly for the cases ruled by surface recombination. However, the PEDOT:PSS/ICBA device shows a reduction in Cion and an increase in Rion. Similarly, in the case of MeO-2PAC device, with better charge extraction and less surface recombination than PEDOT:PSS, the use of ICBA contact increases the ionic density, as indicated by the reduction of Rion. This is the first indication that in our case, with the incorporation of ICBA (cases iii and iv), recombination is not the dominant phenomenon determining the performance of the solar cell.
As mentioned before, the ECM used in this work couples both recombination and transport/injection resistances in a unique parameter named Rrec+tr. In a conventional cell with suitable charge extraction, such as those with C60 (cases i and ii), this parameter is dominated by the recombination. Thus, the typical evolution of the Rrec+tr parameter dominated by recombination as a function of the voltage achieves a minimum value close to Voc, with an exponential increase towards lower voltages, followed by a voltage-independent region as we approach short circuit conditions (Fig. 2(b)). This approach enables a quantitative comparison of recombination based on Rrec+tr, with PEDOT:PSS/C60 devices showing lower recombination resistance, consistent with their lower Voc and higher surface recombination compared to MeO-2PACz/C60.31
To understand the behavior of this parameter when charge extraction is hindered by a mismatch on the energy level alignment between the absorber and ETM, we characterize the PEDOT:PSS/ICBA device, a case with extremely hindered electron extraction and high surface recombination resistance at the hole contact. For these devices, Rrec+tr parameter remains almost constant independently of the voltage applied. It is worth to remark that both PEDOT:PSS/ICBA and PEDOT:PSS/C60 devices display similar Voc, yet the Rrec+tr parameter for PEDOT:PSS/ICBA devices is larger than for MeO-2PACz/ICBA ones, in contrast to what it is expected from their Voc values. Therefore, it can be inferred that when charge extraction and transport are suboptimal, the resistance associated with these processes masks the system recombination resistance, as predicted by the ECM.
To address this limitation of IS caused by the mixed nature of Rrec+tr, it is essential to understand the coupling between extraction, recombination, and transport resistances. Specifically, it is necessary to determine when recombination is the factor dominating the device performance. In PSCs, the current density at the outer contacts of the solar cell, j(V), can be described as the sum of two components: the current density from photogenerated charge carriers, jph, which corresponds to the short-circuit current, jsc, if negligible recombination at zero bias is considered, and the current density from internal recombination within the perovskite layer and at the interfaces, jrec(V). Assuming that photogeneration is a voltage-independent process, as expected from the low exciton binding energy of I-based halide perovskites:
j(V) = jph − jrec(V) | (1) |
Under open-circuit conditions, jph is completely offset by recombination current jrec(Voc), this means that the solar device operates under a kinetic balance of generation and recombination currents. Considering that the recombination resistance (Rrec) could be expressed as the inverse of jrec, it is possible to express jph as:
(2) |
(3) |
We observe that the electronic ideality factor shows strong sensitivity to the light intensity with the implementation of MeO-2PAC (Fig. S6b, ESI†). In this case, reducing surface recombination enhances the contribution of bimolecular recombination, which has been reported to be more sensitive to increases in light intensity due decreased defect-associated charge trapping.48–50 Additionally, drift-diffusion modeling has shown that devices dominated by surface recombination show lower apparent ideality factor values due to a reduction in ionic vacancies within the perovskite active layer,51 consistent with our experimental data. While typical values for m range between 1 and 2 depending on the nature of the recombination process, values outside this range have been reported in PSCs.44,45,47,52–54 To our knowledge, these outliers lack a well-defined physical interpretation.
The shape of the j–V curve is influenced by the variation of the recombination flux with applied voltage, which is modeled through m and the series resistance voltage loss.24 Consequently, the current at any specific voltage (VF), in the j–V curve can be expressed as:
(4) |
Eqn (4) presents a method to recalculate the final current at each voltage of the j–V curve using the parameters obtained by the ECM of the impedance data. Specifically, from Rrec+tr when this parameter is dominated by the recombination (and thus, it is possible to write Rrec+tr = Rrec), and the ideality factor. In those cases, for cells with optimal charge extraction, the ideality factor could be obtained from two approaches: directly from the impedance fitting using Rrec+trvs. V (Fig. S6a, ESI†) or corelating the jsc with Rrec+tr(Voc) (eqn (2)). The parameters used for the current recalculation are presented in the Table S1 (ESI†). Fig. 3 shows a remarkable correlation between experimental j–V curves and the j–V reconstruction, regardless of the method used to calculate m. The reconstructed j–V is compared to the average current measured at each DC vias during the IS. This so called “experimental curve” exhibits values comparable to the reverse j–V scan post-IS (Fig. S2, ESI†), indicating that the analysis is conducted under near steady-state conditions for each device, where factors like hysteresis or degradation are not interfering with the curve interpretation.
Fig. 3 Experimental j–V curve (dots) and its reconstruction (eqn (4)) by using m-values obtained either the slope of Rrecvs. Vapp (squares) or from Jrec (eqn (2), triangles) at different illumination intensities for (a) PEDOT:PSS/C60 and (b) MeO-2PACz/C60 devices. The voltage applied is optimized by the series resistance contribution as Vd = Vapp − jRs. |
The successful reconstruction of the j–V curve for cases i and ii indicates a reliable estimation of the device recombination resistance from the Rrec+tr parameter. Furthermore, it corroborates that the photogenerated current is independent of the voltage applied and the shape of the j–V curve depends solely on the recombination processes. The calculated Rrec+tr = Rrec encompasses accurately the different recombination mechanisms, including bulk recombination in devices with less recombinative HTMs, such as MeO-2PACz (case i, Fig. 3(a)), and high surface recombination in devices with PEDOT:PSS (case II, Fig. 3(b)).
For the cases with hindered charge extraction (iii and iv) the Rrec+trvs. Vapp plot (Fig. 2(b)) presents an atypical response, maintaining independent to the change in voltage. Thus, as previously discussed, in these devices it is not possible to extract m from the plot slope, leading to try to calculate the ideality factor using only eqn (2). Interestingly, no Rrec+tr(VF) (where VF represents bias values close to open circuit conditions) leads to a m value that can successfully reconstruct the experimental j–V curve (Fig. S7, ESI†). This strongly indicates that charge extraction and transport resistance are dominating the device performance, masking the recombination resistance into the Rrec+tr parameter. Thus, using the j–V reconstruction is possible to determine when recombination resistance or transport/extraction resistance is dominating in Rrec+tr.
To generalize this method, we implemented one of the most basic equivalent circuit models (ECMs) used in IS analysis (Fig. S8, ESI†). In this circuit, the high frequency (HF) and low frequency (LF) response are modeled by pairs of resistive and capacitive elements in series. Consequently, the recombination and transport processes are also interpreted in series, which hinders the accurate reconstruction of the j–V curve (Fig. S9, ESI†).
The perovskite solutions were filtered with 0.22 μm PTFE filter. The films were deposited using 30 μL of the precursor solution and spin coated with two steps, firstly, 1000 rpm for 12 s and, secondly, 5000 rpm for 27 s. After 22 s of having started the second step, 200 μL of CB was deposited like antisolvent and the annealing treatment was carried out at 100 °C for 30 min. The ETM C60 was thermal evaporated 30 nm under a pressure less than 10−6 mbar. ICBA solution (20 mg mL−1 dissolved in CB) was deposited by spin coating on top of the perovskite film at 1200 rpm for 30 s and annealing at 100 °C for 10 min. Finally, the samples were transferred into a vacuum chamber, BCP (6 nm) and Ag (100 nm) were sequentially deposited by thermal evaporation under a pressure less than 10−6 mbar.
Footnote |
† Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d4cp04143g |
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