Lithography-free electrical transport measurements on 2D materials by direct microprobing

Abstract

We present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS₂ flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS₂ devices fabricated by the conventional lithographic process. We also show that this method can be used with other 2D materials.