Issue 2, 2023

Large-scale controlled coupling of single-photon emitters to high-index dielectric nanoantennas by AFM nanoxerography

Abstract

Improving the brightness of single-photon sources by means of optically resonant nanoantennas is a major stake for the development of efficient nanodevices for quantum communications. We demonstrate that nanoxerography by atomic force microscopy makes possible the fast, robust and repeatable positioning of model quantum nanoemitters (nitrogen-vacancy NV centers in nanodiamonds) on a large-scale in the gap of silicon nanoantennas with a dimer geometry. By tuning the parameters of the nanoxerography process, we can statistically control the number of deposited nanodiamonds, yielding configurations down to a unique single photon emitter coupled to these high index dielectric nanoantennas, with high selectivity and enhanced brightness induced by a near-field Purcell effect. Numerical simulations are in very good quantitative agreement with time-resolved photoluminescence experiments. A multipolar analysis reveals in particular all the aspects of the coupling between the dipolar single emitter and the Mie resonances hosted by these simple nanoantennas. This proof of principle opens a path to a genuine and large-scale spatial control of the coupling of punctual quantum nanoemitters to arrays of optimized optically resonant nanoantennas. It paves the way for future fundamental studies in quantum nano-optics and toward integrated photonics applications for quantum technologies.

Graphical abstract: Large-scale controlled coupling of single-photon emitters to high-index dielectric nanoantennas by AFM nanoxerography

Supplementary files

Article information

Article type
Paper
Submitted
06 Okt. 2022
Accepted
30 Nov. 2022
First published
09 Dec. 2022

Nanoscale, 2023,15, 599-608

Large-scale controlled coupling of single-photon emitters to high-index dielectric nanoantennas by AFM nanoxerography

M. Humbert, R. Hernandez, N. Mallet, G. Larrieu, V. Larrey, F. Fournel, F. Guérin, E. Palleau, V. Paillard, A. Cuche and L. Ressier, Nanoscale, 2023, 15, 599 DOI: 10.1039/D2NR05526K

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