X-Ray reflection studies on the monolayer-mediated growth of mesostructured MCM-41 silica at the air/water interface

Abstract

X-Ray reflection has been used to study the nucleation and growth of thin films of a silica–surfactant mesophase (MCM-41) at the air/water interface in the presence and absence of an insoluble lipid monolayer of phosphatidylcholine; the rate of self-assembly and structural order of films comprising up to four micellar layers were enhanced under the lipid monolayer.