Issue 14, 2016
From the journal:

Nanoscale

Defect segregation and optical emission in ZnO nano- and microwires†

W. T. Ruane,*a   K. M. Johansen,b   K. D. Leedy,c   D. C. Look,cd   H. von Wenckstern,e   M. Grundmann,e   G. C. Farlowf  and  L. J. Brillsong  

* Corresponding authors

a Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA
E-mail: ruane.3@osu.edu

b University of Oslo, Centre for Materials Science and Nanotechnology, 0318 Oslo, Norway

c Air Force Research Laboratory, Sensors Directorate, WPAFB, OH 45433, USA

d Semiconductor Research Center, Wright State University, Dayton, OH 45435, USA

e Institut für Experimentelle Physik II, Universität Leipzig, Linnéstr. 5, 04103 Leipzig, Germany

f Department of Physics, Wright State University, Dayton, OH 45435, USA

g Department of Physics and Department of Electrical & Computer Engineering, The Ohio State University, Columbus, OH 43210, USA

Abstract

The spatial distribution of defect related deep band emission has been studied in zinc oxide (ZnO) nano- and microwires using depth resolved cathodoluminescence spectroscopy (DRCLS) in a hyperspectral imaging (HSI) mode within a UHV scanning electron microscope (SEM). Three sets of wires were examined that had been grown by pulsed laser deposition or vapor transport methods and ranged in diameter from 200 nm–2.7 μm. This data was analyzed by developing a 3D DRCLS simulation and using it to estimate the segregation depth and decay profile of the near surface defects. We observed different dominant defects from each growth process as well as diameter-dependent defect segregation behavior.

Graphical abstract: Defect segregation and optical emission in ZnO nano- and microwires

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Article information

DOI
https://doi.org/10.1039/C5NR08248J
Article type
Paper
Submitted
22 Nov 2015
Accepted
11 Mar 2016
First published
11 Mar 2016
This article is Open Access
Creative Commons BY-NC license

Nanoscale, 2016,8, 7631-7637

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Defect segregation and optical emission in ZnO nano- and microwires

W. T. Ruane, K. M. Johansen, K. D. Leedy, D. C. Look, H. von Wenckstern, M. Grundmann, G. C. Farlow and L. J. Brillson, Nanoscale, 2016, 8, 7631 DOI: 10.1039/C5NR08248J

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