Defective 2D silicon phosphide monolayers for the nitrogen reduction reaction: a DFT study

Abstract

Electroreduction of N₂ is a highly promising route for NH₃ production. The lack of efficient catalysts that can activate and then reduce N₂ into NH₃ limits this as a pragmatic application. In this work, a 2D layered group IV–V material, silicon phosphide (SiP), is evaluated as a suitable substrate for the electrochemical nitrogen reduction reaction (ENRR). To capture N₂, one phosphorus (P) defect was introduced on the plane of SiP. DFT calculations found that the defective SiP monolayer (D1-SiP, which is defined by the P-defect on SiP) exhibits enormous prospects towards the ENRR because of enhanced electron conductivity, good activation on N₂, lower limiting potential (U_L = −0.87 V) through the enzymatic pathway, smooth charge transfer between the catalyst and the reaction species, and robust thermal stability. Importantly, D1-SiP demonstrates the suppressed activities on producing of H₂ and N₂H₄ side-products. This research demonstrates the potential of 2D metal-free Si-based catalysts for nitrogen fixation and further enriches the study of group IV–V materials for the ENRR.